Active Probe Atomic Force Microscopy
A Practical Guide on Precision Instrumentation
By: Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi
eText | 6 February 2024
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ISBN: 9783031442339
ISBN-10: 3031442334
Published: 6th February 2024
Format: ePUB
Language: English
Publisher: Springer International Publishing
You Can Find This eBook In
Non-FictionEngineering & TechnologyTechnology in GeneralInstruments & Instrumentation EngineeringEngineering Measurement & CalibrationScienceScience in GeneralScientific StandardsMensuration & Systems of MeasurementElectronics & Communications EngineeringElectronics EngineeringMechanical Engineering & Materials
This product is categorised by
- Non-FictionEngineering & TechnologyTechnology in GeneralInstruments & Instrumentation EngineeringEngineering Measurement & Calibration
- Non-FictionScienceScience in GeneralScientific StandardsMensuration & Systems of Measurement
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics Engineering
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMechanical Engineering
- Non-FictionScienceChemistryAnalytical ChemistrySpectrum Analysis
- Non-FictionEngineering & TechnologyTechnology in GeneralNanotechnology
- Non-FictionEngineering & TechnologyIndustrial Chemistry & Manufacturing TechnologiesOther Manufacturing TechnologiesPrecision Instruments Manufacture
- Non-FictionEngineering & TechnologyEnergy Technology & EngineeringElectrical Engineering
- Non-FictionScienceChemistryPhysical Chemistry