Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices

Cover -- Table of Contents -- PREFACE -- I. Noise Sources -- 1/f Noise Sources -- Noise Sources in GaN/AlGaN Quantum Wells and Devices -- 1/f Noise in Nanomaterials and Nanostructures: Old Questions in a New Fashion -- 1/f Spectra as a Consequence of the Randomness of Variance -- Quantum Phase Locking, 1/f Noise and Entanglement -- Shot Noise in Mesoscopic Devices and Quantum Dot Networks -- Super-Poissonian Noise in Nanostructures -- Stochastic and Deterministic Models of Noise -- II. Noise in Nanoscale Devices -- Noise in Optoelectronic Devices -- Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers -- Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels -- Noise of High Temperature Superconducting Bolometers -- 1/f Noise in MOSTs: Faster is Noisier -- Experimental Assessment of Quantum Effects in the Low- Frequency Noise and RTS of Deep Submicron MOSFETs -- Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs -- Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors -- Noise Modelling in Low Dimensional Electronic Structures -- Correlation Noise Measurements and Modeling of Nanoscale MOSFETs -- Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs -- High Frequency Noise Sources Extraction in Nanometique MOSFETs -- Informative "Passport Data" of Surface Nano- and Microstructures -- III. Noise Measurement Technique -- Noise Measurement Techniques -- Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures -- Correlation Spectrum Analyzer: Principles and Limits in Noise Measurements -- Measurement and Analysis Methods for Random Telegraph Signals -- RTS In Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation -- Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region -- Measurements of Low Frequency Noise in Nano-Grained RuO2+Glass Films Below 1 K -- Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices -- The Noise Background Suppression of Noise Measuring Set-Up -- Accuracy of Noise Measurements for 1/f and GR Noise -- Radiofrequency and Microwave Noise Metrology -- Treatment of Noise Data in Laplace Plane -- Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation -- Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices -- Hooge Mobility Fluctuations in n-InSb Magnetoresistors as a Reference for Access Resistance LFNoise Measurements of SiGe Metamorphic HMOS FETs -- Optimised Preamplifier for LF-Noise MOSFET Characterization -- Net of YBCO and LSMO Thermometers for Bolometric Applications -- Diagnostics of GaAs Light Emitting Diode pn Junctions -- New Tools for Fast and Sensitive Noise Measurements -- Using a Novel, Computer Controlled Automatic System for LF Noise Measurements under Point Probes -- AUTHOR INDEX.