
Applied Crystallography : Proceedings of the XVII International Conference Wisla, Poland 31 August-4 September, 1997
Proceedings of the XVII International Conference Wisla, Poland 31 August-4 September, 1997
By: Danuta Stroz (Editor), Henryk Morawiec (Editor)
Hardcover | 1 December 1997
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512 Pages
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Laboratory X-rays and structure determination from powder diffraction data | p. 3 |
A temperature-dependent powder diffraction study of lanthanum (potassium) nitrates | p. 14 |
Single crystal structure determination on powders by electron crystallography | p. 18 |
X-ray diffraction study on K[subscript 2]ZnCl[subscript 4] down to 10 K | p. 28 |
The phase diagram of the K[subscript 2]MoO[subscript 4] - K[subscript 2]WO[subscript 4] system | p. 33 |
Structure rerefinement of L-glutamic acid with the aid of the X-ray 4-circle diffractometer | p. 40 |
Grazing incidence X-ray diffraction studies of two-dimensional packing properties of amphiphilic alcohols at air-water interface | p. 43 |
Phase identification in Al-Fe-Mn-Si alloys | p. 49 |
Structure of Al-Cu-Fe alloy with a quasicrystalline phase | p. 55 |
On unique description of space groups | p. 59 |
Quantitative phase analysis with the Rietveld method | p. 65 |
The new Seifert Rietveld program and its application to quantitative phase analysis | p. 87 |
From precursors to ceramics: heterogeneous structures in the anhydrous lanthanide perchlorato complexes | p. 93 |
Estimation of inversion parameter of magnesioferrite by Rietveld refinement method | p. 97 |
The quantitative phase analysis of a commercial tube of the duplex stainless steel | p. 101 |
Paracrystallinity | p. 107 |
Paracrystalline distortions, inherent strains and crystallite size in polymers | p. 116 |
On the paracrystallinity of opal | p. 135 |
Crystal size and crystallinity: X-ray diffraction and electron microscopy versus Raman vibrational spectroscopy | p. 141 |
EXAFS studies of Fe[subscript 66]Cr[subscript 8]Cu[subscript 1]Nb[subscript 3]Si[subscript 13]B[subscript 9] amorphous and nanocrystalline alloys | p. 148 |
Crystallization of amorphous Al[subscript 85]Y[subscript 10]Ni[subscript 5] alloy | p. 152 |
Radial distribution function and Rietveld refinement on modelling the amorphous two-component alloy structure | p. 156 |
The amorphous Fe-Si-B and Fe-Cr-Si-B alloy structures studied by radial distribution function and Rietveld refinement | p. 160 |
Crystallisation of amorphous alloys of Fe-X-Si-B (X=Cr,Mo) type | p. 164 |
Amorphous component in quantitative phase analysis | p. 168 |
Small-angle scattering studies of solids with structure on more than one [ ] scale in the interval between 5[Angstrom] and 10[superscript 4][Angstrom] | p. 174 |
Interface characterization by SAS intensity tails | p. 197 |
SAXS studies on porous materials | p. 208 |
SAXS investigation of the siliceous materials with surface polymer layers | p. 212 |
SAXS investigation of the silica gel with carbon deposit | p. 216 |
The influence of the catalyst composition on the structure of silica aerogels | p. 220 |
New concepts of texture analysis and their contribution to our understanding of materials properties | p. 226 |
Quantitative approach to orientation difference distribution analysis based on model function | p. 239 |
Development of the deformation and recrystallization textures in Cu-6.5Al single crystals | p. 242 |
Relation between deformation and recrystallization textures in Cu-Al alloys | p. 248 |
Influence of grain composition and pressing process on the anisotropy of the graphite products | p. 252 |
Cold rolling and annealing textures in Cu-3.0Si alloy | p. 256 |
Deformation and recrystallization textures affected by the change of the deformation path in CuGe8 alloy | p. 260 |
Determination of grain orientations in recrystallized ODS alloy INCOLOY MA956 | p. 264 |
Structure and phase transformation of nanometer-sized particles of alloys examined by TEM and electron diffraction | p. 270 |
Temperature resolved X-ray diffractometry | p. 278 |
Structure of Al[subscript 50]Fe[subscript 25]Ti[subscript 25] alloy formed by mechanical alloying | p. 283 |
The atomic structure features of rapidly quenched, ion irradiated and ball milled intermetallic compuonds in Ni-Nb-V system | p. 287 |
The structure changes in 18/10 stainless steel caused by irradiation with Ar[superscript +] ions (40keV) | p. 294 |
Structural studies of shape memory alloys by means of HREM | p. 297 |
Surface and structural modifications induced by the dezincification of the [alpha] and [beta] phases of Cu-Zn | p. 308 |
Structure of Cu-Al-Nb shape memory alloys | p. 312 |
Ordering effects in Ni[subscript 3]Al polycrystals | p. 316 |
X-ray studies of the reversible B2[actual symbol not reproducible]R transition in TiNiCo shape memory alloy for maxillofacial and orthopaedic surgery | p. 320 |
On precipitation of TiC[subscript x] crystals by reaction between graphite and Co-Ti melts | p. 324 |
The influence of substitutional carbon and of hydrostatic pressure on the thermal stability of SiGe/Si heterostructures | p. 329 |
Structural characteristics of the pseudo-perovskite relaxor ferroelectric Pb(Sc[subscript 0.5], Ta[subscript 0.5])O[subscript 3] | p. 333 |
Diffuse scattering by weakly and strongly distorted crystals containing precipitates | p. 338 |
X-ray analysis of ageing kinetics in nickel-based single crystals | p. 353 |
Pressure effect on oxygen precipitate nucleation in Cz-Si, its structural evolution and phase transformation | p. 358 |
Crystallographic aspects of the discontinuous precipitation reaction in a Ni-4at.%Sn alloy | p. 362 |
Grain boundary migration in Ni-26 wt.% Mo alloy | p. 366 |
Computer simulation of "order-order" kinetics in Ll[subscript 2] superstructure | p. 370 |
Ordering processes in CuZnAlSn alloys analysed with ALCHEMI | p. 374 |
Studies of stress states in single crystals of [beta][subscript 1]-CuZnAl using the X-ray topography method | p. 378 |
X-ray reflectivity in thin film studies | p. 384 |
Characterization of thin layers by X-ray reflectometry | p. 394 |
Tungsten thin film characterisation by means of X-ray diffraction | p. 398 |
X-ray diffraction analysis of microstructure formation in electrodeposits | p. 402 |
Computer simulation of X-ray scattering by surface layers with concentration gradient | p. 408 |
Optimising hexaphenyl thin film quality for opto-electronic applications by heat treatment | p. 413 |
Surfaces, coatings and their residual stresses - new methodological approach | p. 417 |
Diffraction characteristics of some physical technologies for steel cutting | p. 423 |
Investigations of macrostresses by X-ray integral method | p. 427 |
Room temperature studies on oxygen adsorption of a TiNi alloy surface under low pressure of air or oxygen | p. 431 |
Crystal structure and microwave dielectric properties of tungsten bronze-type Ba[subscript 6-3x]R[subscript 8+2x]Ti[subscript 18]O[subscript 54] (R=La, Pr, Nd and Sm) solid solutions | p. 440 |
X-ray diffraction studies of some composites belonging to the Al[subscript 2]O[subscript 3]-SiO[subscript 2] and Al[subscript 2]O[subscript 3]-ZrO[subscript 2] systems | p. 448 |
Influence of free charge and elastic properties on negative thermal expansion of semiconductors | p. 454 |
Crystallization of Ga-Mg-Zn alloy | p. 458 |
Influence of lattice rotations on the intensity distribution of X-ray scattering | p. 465 |
HRTEM image simulation in the study of planar defects in GaAs:Te crystals | p. 471 |
Quantitative TEM characterization of the dislocation substructure in INCOLOY MA956 | p. 475 |
Oxygen diffusion and structure of oxygen-related defects in silicon: molecular quantum chemical models and reciprocal lattice mapping | p. 479 |
Reciprocal lattice mapping of pressure-annealed Czochralski grown silicon | p. 483 |
TEM investigations of lattice dislocations interaction with interphase boundaries | p. 487 |
Table of Contents provided by Blackwell. All Rights Reserved. |
ISBN: 9789810232832
ISBN-10: 9810232837
Published: 1st December 1997
Format: Hardcover
Language: English
Number of Pages: 512
Audience: Professional and Scholarly
Publisher: WORLD SCIENTIFIC PUB CO INC
Country of Publication: SG
Dimensions (cm): 24.41 x 16.99 x 2.87
Weight (kg): 1.01
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