Atomic Force Microscopy for Energy Research

By: Cai Shen (Editor)

Write A Review

Paperback | 4 October 2024

At a Glance

Paperback
458 Pages

Dimensions(cm)
23.39 x 15.6 x 2.36

Paperback

RRP $112.00

$85.25

24%OFF

or 4 interest-free payments of $21.31 with

or

Aims to ship in 7 to 10 business days

Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials-such as lithium-ion batteries, solar cells, and other energy-related materials-are addressed.

FEATURES

First book to focus on application of AFM for energy research
Details the use of advanced AFM and addresses many types of functional AFM tools
Enables readers to operate an AFM instrument successfully and to understand the data obtained
Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy

With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.

Shipping

	Standard Shipping	Express Shipping
Metro postcodes:	$9.99	$14.95
Regional postcodes:	$9.99	$14.95
Rural postcodes:	$9.99	$14.95

How to return your order

At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.

Additional postage charges may be applicable.