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248 Pages
Revised
22.9 x 15.2 x 1.27
Hardcover
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Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.
Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. Basics of Interferometry, Second Edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.
- Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems
- Practical details enrich understanding for readers new to this material
- New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)
Preface to the First Edition | p. xvii |
Preface to the Second Edition | p. xix |
Acknowledgments | p. xxi |
Introduction | p. 1 |
Interference: A Primer | p. 3 |
Light Waves | p. 3 |
Intensity in an Interference Pattern | p. 5 |
Visibility of Interference Fringes | p. 6 |
Interference with a Point Source | p. 6 |
Localization of Fringes | p. 7 |
Summary | p. 9 |
Problems | p. 10 |
Further Reading | p. 12 |
Two-Beam Interferometers | p. 13 |
Wavefront Division | p. 13 |
Amplitude Division | p. 14 |
The Rayleigh Interferometer | p. 15 |
The Michelson Interferometer | p. 16 |
Fringes Formed with a Point Source | p. 17 |
Fringes Formed with an Extended Source | p. 17 |
Fringes Formed with Collimated Light | p. 17 |
Applications | p. 18 |
The Mach-Zehnder Interferometer | p. 18 |
The Sagnac Interferometer | p. 19 |
Summary | p. 20 |
Problems | p. 20 |
Further Reading | p. 22 |
Source-Size and Spectral Effects | p. 23 |
Coherence | p. 23 |
Source-Size Effects | p. 24 |
Slit Source | p. 24 |
Circular Pinhole | p. 25 |
Spectral Effects | p. 25 |
Polarization Effects | p. 25 |
White-Light Fringes | p. 26 |
Channeled Spectra | p. 27 |
Summary | p. 28 |
Problems | p. 28 |
Further Reading | p. 30 |
Multiple-Beam Interference | p. 31 |
Multiple-Beam Fringes by Transmission | p. 31 |
Multiple-Beam Fringes by Reflection | p. 33 |
Multiple-Beam Fringes of Equal Thickness | p. 34 |
Fringes of Equal Chromatic Order (FECO Fringes) | p. 34 |
The Fabry-Perot Interferometer | p. 35 |
Summary | p. 36 |
Problems | p. 36 |
Further Reading | p. 36 |
The Laser as a Light Source | p. 39 |
Lasers for Interferometry | p. 39 |
Laser Modes | p. 40 |
Single-Wavelength Operation of Lasers | p. 42 |
Polarization of Laser Beams | p. 43 |
Wavelength Stabilization of Lasers | p. 43 |
Laser-Beam Expansion | p. 43 |
Problems with Laser Sources | p. 45 |
Laser Safety | p. 46 |
Summary | p. 46 |
Problems | p. 46 |
Further Reading | p. 48 |
Photodetectors | p. 49 |
Photomultipliers | p. 49 |
Photodiodes | p. 50 |
Charge-Coupled Detector Arrays | p. 51 |
Linear CCD Sensors | p. 52 |
Area CCD Sensors | p. 52 |
Frame-Transfer CCD Sensors | p. 52 |
Photoconductive Detectors | p. 54 |
Pyroelectric Detectors | p. 54 |
Summary | p. 54 |
Problems | p. 55 |
Further Reading | p. 56 |
Measurements of Length | p. 57 |
The Definition of the Metre | p. 57 |
Length Measurements | p. 58 |
The Fractional-Fringe Method | p. 59 |
Fringe Counting | p. 59 |
Heterodyne Techniques | p. 59 |
Synthetic Long-Wavelength Signals | p. 60 |
Frequency Scanning | p. 61 |
Environmental Effects | p. 62 |
Measurements of Changes in Length | p. 62 |
Phase Compensation | p. 62 |
Heterodyne Methods | p. 62 |
Dilatometry | p. 62 |
Summary | p. 63 |
Problems | p. 63 |
Further Reading | p. 66 |
Optical Testing | p. 67 |
The Fizeau Interferometer | p. 67 |
The Twyman-Green Interferometer | p. 70 |
Analysis of Wavefront Aberrations | p. 71 |
Laser Unequal-Path Interferometers | p. 72 |
The Point-Diffraction Interferometer | p. 72 |
Shearing Interferometers | p. 73 |
Lateral Shearing Interferometers | p. 74 |
Radial Shearing Interferometers | p. 76 |
Grazing-Incidence Interferometry | p. 77 |
Summary | p. 77 |
Problems | p. 78 |
Further Reading | p. 81 |
Digital Techniques | p. 83 |
Digital Fringe Analysis | p. 83 |
Digital Phase Measurements | p. 84 |
Testing Aspheric Surfaces | p. 85 |
Direct Measurements of Surface Shape | p. 86 |
Long-Wavelength Tests | p. 86 |
Tests with Shearing Interferometers | p. 86 |
Tests with Computer-Generated Holograms | p. 87 |
Summary | p. 88 |
Problems | p. 88 |
Further Reading | p. 91 |
Macro- and Micro-Interferometry | p. 93 |
Interferometry of Refractive Index Fields | p. 93 |
The Mach-Zehnder Interferometer | p. 93 |
Interference Microscopy | p. 95 |
Multiple-Beam Interferometry | p. 96 |
Two-Beam Interference Microscopes | p. 96 |
The Nomarski Interferometer | p. 99 |
Summary | p. 100 |
Problems | p. 101 |
Further Reading | p. 103 |
White-Light Interference Microscopy | p. 105 |
White-Light Interferometry | p. 105 |
White-Light Phase-Shifting Microscopy | p. 106 |
Spectrally Resolved Interferometry | p. 107 |
Coherence-Probe Microscopy | p. 107 |
Summary | p. 109 |
Problems | p. 109 |
Further reading | p. 110 |
Holographic and Speckle Interferometry | p. 111 |
Holographic Interferometry | p. 111 |
Holographic Nondestructive Testing | p. 112 |
Holographic Strain Analysis | p. 112 |
Holographic Vibration Analysis | p. 113 |
Speckle Interferometry | p. 114 |
Electronic Speckle-Pattern Interferometry | p. 117 |
Studies of Vibrating Objects | p. 118 |
Summary | p. 119 |
Problems | p. 119 |
Further Reading | p. 120 |
Interferometric Sensors | p. 121 |
Laser-Doppler Interferometry | p. 121 |
Measurements of Vibration Amplitudes | p. 122 |
Fiber Interferometers | p. 123 |
Rotation Sensing | p. 125 |
Laser-Feedback Interferometers | p. 126 |
Gravitational Wave Detectors | p. 127 |
Optical Signal Processing | p. 128 |
Interferometric Switches | p. 128 |
Interferometric Logic Gates | p. 128 |
Summary | p. 129 |
Problems | p. 129 |
Further Reading | p. 132 |
Interference Spectroscopy | p. 133 |
Resolving Power and Etendue | p. 133 |
The Fabry-Perot Interferometer | p. 134 |
The Scanning Fabry-Perot Interferometer | p. 135 |
The Confocal Fabry-Perot Interferometer | p. 135 |
The Multiple-Pass Fabry-Perot Interferometer | p. 136 |
Interference Filters | p. 136 |
Birefringent Filters | p. 137 |
Interference Wavelength Meters | p. 137 |
Laser Frequency Measurements | p. 138 |
Summary | p. 139 |
Problems | p. 140 |
Further Reading | p. 143 |
Fourier Transform Spectroscopy | p. 145 |
The Multiplex Advantage | p. 145 |
Theory | p. 146 |
Practical Aspects | p. 148 |
Computation of the Spectrum | p. 149 |
Applications | p. 149 |
Summary | p. 149 |
Problems | p. 149 |
Further Reading | p. 151 |
Interference with Single Photons | p. 153 |
Interference-The Quantum Picture | p. 153 |
Single-Photon States | p. 154 |
Interference with Single-Photon States | p. 156 |
Interference with Independent Sources | p. 157 |
Fourth-Order Interference | p. 161 |
Summary | p. 162 |
Problems | p. 162 |
Further Reading | p. 163 |
Building an Interferometer | p. 165 |
Further Reading | p. 167 |
Monochromatic Light Waves | p. 169 |
Complex Representation | p. 169 |
Optical Intensity | p. 170 |
Phase Shifts on Reflection | p. 171 |
Diffraction | p. 173 |
Diffraction Gratings | p. 174 |
Polarized Light | p. 177 |
Production of Polarized Light | p. 177 |
Quarter-Wave and Half-Wave Plates | p. 177 |
The Jones Calculus | p. 179 |
The Poincare Sphere | p. 180 |
The Pancharatnam Phase | p. 183 |
The Pancharatnam Phase | p. 183 |
Achromatic Phase Shifters | p. 183 |
Switchable Achromatic Phase Shifters | p. 185 |
The Twyman-Green Interferometer: Initial Adjustment | p. 187 |
The Mach-Zehnder Interferometer: Initial Adjustment | p. 191 |
Fourier Transforms and Correlation | p. 193 |
Fourier Transforms | p. 193 |
Correlation | p. 194 |
Coherence | p. 195 |
Quasi-Monochromatic Light | p. 195 |
The Mutual Coherence Function | p. 196 |
Complex Degree of Coherence | p. 197 |
Visibility of the Interference Fringes | p. 197 |
Spatial Coherence | p. 198 |
Temporal Coherence | p. 199 |
Coherence Length | p. 199 |
Heterodyne Interferometry | p. 201 |
Laser Frequency Shifting | p. 203 |
Evaluation of Shearing Interferograms | p. 205 |
Lateral Shearing Interferometers | p. 205 |
Radial Shearing Interferometers | p. 205 |
Phase-Shifting Interferometry | p. 209 |
Error-Correcting Algorithms | p. 210 |
Holographic Imaging | p. 211 |
Hologram Recording | p. 211 |
Image Reconstruction | p. 212 |
Laser Speckle | p. 215 |
Laser Frequency Modulation | p. 219 |
Index | p. 221 |
Table of Contents provided by Ingram. All Rights Reserved. |
ISBN: 9780123735898
ISBN-10: 0123735890
Published: 9th October 2006
Format: Hardcover
Language: English
Number of Pages: 248
Audience: Professional and Scholarly
Publisher: Academic Press
Country of Publication: US
Edition Number: 2
Edition Type: Revised
Dimensions (cm): 22.9 x 15.2 x 1.27
Weight (kg): 0.52
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