Characterization of Semiconductor Materials, Volume 1 : Principles and Methods :  Principles and Methods - Gary F. McGuire

Characterization of Semiconductor Materials, Volume 1 : Principles and Methods

Principles and Methods

By: Gary F. McGuire

Hardcover | 1 August 1989

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Characterization of semiconductor materials and methods used to characterize them are described extensively in this book. Contents include: Electrical Characterization of Semiconductor Materials and Devices Secondary Ion Mass Spectrometry Photoelectron Spectroscopy Application to Semiconductors Ion/Solid Interactions in Surface Analysis Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy.

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