Introduction | |
Microwave Circuits and Computer-Aided Design | p. 3 |
Evolution of Microwave Circuits | p. 3 |
Computer-Aided Design Approach | p. 8 |
Outline of the Book | p. 14 |
References | p. 19 |
Microwave Network Representation | p. 25 |
Abcd Parameters | p. 26 |
Scattering Parameters | p. 30 |
Definition and General Properties | p. 30 |
Relationship with Other Representations | p. 33 |
Transfer Scattering Matrix Representation | p. 36 |
Abcd, S-And T-Matrices for some of the Commonly Used Two-Ports | p. 39 |
References | p. 43 |
Modelling of Circuit Elements | |
Characterization of Transmission Structures | p. 47 |
Coaxial Lines | p. 49 |
Waveguides | p. 53 |
Rectangular Waveguides | p. 53 |
Circular Waveguides | p. 55 |
Striplines | p. 57 |
Microstrip Lines | p. 60 |
Slotlines | p. 65 |
Coplanar Lines | p. 67 |
Coupled Striplines | p. 72 |
Coupled Microstrip Lines | p. 76 |
References | p. 85 |
Sensitivities of Transmission Structures | p. 91 |
Introduction | p. 91 |
Definitions | p. 91 |
Applications of Sensitivity Analysis | p. 92 |
Tolerance Analysis of Transmission Lines | p. 93 |
Coaxial Lines | p. 95 |
Waveguides | p. 97 |
Striplines and Microstrip Lines | p. 100 |
Striplines | p. 100 |
Microstrip Lines | p. 102 |
Slotlines and Coplanar Lines | p. 106 |
Slotlines | p. 106 |
Coplanar Lines | p. 112 |
Coupled Striplines and Coupled Microstrip Lines | p. 117 |
Coupled Striplines | p. 117 |
Coupled Microstrip Lines | p. 120 |
References | p. 126 |
Characterization of Discontinuities-I: Coaxial Lines and Waveguides | p. 129 |
Introduction | p. 129 |
Coaxial Line Discontinuities | p. 131 |
Capacitive Gaps in Coaxial Lines | p. 131 |
Steps in Coaxial Lines | p. 135 |
Capacitive Windows in Coaxial Lines | p. 136 |
T-Junction or Stub in Coaxial Lines | p. 139 |
Rectangular Waveguide Discontinuities | p. 139 |
Posts in a Waveguide | p. 139 |
Strips in Waveguides | p. 149 |
Diaphragms or Windows in Waveguides | p. 152 |
Steps in Waveguides | p. 159 |
Right-Angled Bends or Corners in Waveguides | p. 166 |
T-junctions | p. 169 |
Circular and Elliptical Apertures in Waveguides | p. 173 |
References | p. 177 |
Characterization of Discontinuities-II: Striplines and Microstrip Lines | p. 179 |
Stripline Discontinuities | p. 181 |
Open-End | p. 183 |
Round-Hole | p. 184 |
Gap | p. 185 |
Step in Width | p. 186 |
Bend | p. 186 |
T-junction | p. 188 |
Microstrip Discontinuities | p. 189 |
Open-End | p. 190 |
Gap | p. 191 |
Notch | p. 192 |
Step in Width | p. 192 |
Right-angled Bend | p. 195 |
T-junction | p. 195 |
Cross-junction | p. 197 |
References | p. 200 |
Lumped Elements in Microwave Circuits | p. 205 |
Basic Considerations | p. 205 |
Design of Lumped Elements | p. 206 |
Resistors and Inductors | p. 207 |
Capacitors | p. 213 |
Measurements of Lumped Element Parameters | p. 220 |
References | p. 226 |
Two-Dimensional Planar Components | p. 229 |
Basic Concepts | p. 231 |
Green's Function Approach | p. 237 |
Evaluation of Green's Functions | p. 242 |
Method of Images | p. 243 |
Expansion of Green's Function in Eigenfunctions | p. 244 |
Green's Functions for Various Configurations | p. 247 |
Segmentation and Desegmentation | p. 251 |
Numerical Methods for Arbitrary Shapes | p. 253 |
Scaling for Planar Circuits | p. 256 |
Frequency Scaling | p. 257 |
Impedance Scaling | p. 257 |
Designs of Stripline Type Circuits from a Microstrip Type Planar Circuit (and Vice Versa) | p. 257 |
References | p. 259 |
Models for Microwave Semiconductor Devices | p. 263 |
Schottky-Barrier and Point-Contact Diodes | p. 264 |
Varactor Diodes | p. 267 |
Pin Diodes | p. 268 |
Bipolar Transistors and Mesfets | p. 269 |
Bipolar Transistors | p. 269 |
MESFETs | p. 277 |
Gunn and Impatt Diodes | p. 285 |
Gunn Diodes | p. 285 |
Impatt Diodes | p. 289 |
References | p. 293 |
Measurement Techniques for Modelling | p. 295 |
Microwave Network Analyzers | p. 296 |
Network Analyzer | p. 296 |
Automatic Network Analyzer | p. 301 |
Six-Port Network Analyzer | p. 303 |
System Error Measurement and Correction | p. 307 |
General Considerations | p. 307 |
One-port Device Measurements | p. 311 |
Two-port Measurements | p. 313 |
Three-port and Multiport Measurements | p. 317 |
Characterization of Connectors | p. 319 |
Data Reduction Techniques | p. 321 |
References | p. 323 |
Analysis | |
Evaluation of Circuit Performance | p. 329 |
Circuits Consisting of Two-Ports | p. 330 |
Use of Symmetry in the Circuit Analysis | p. 330 |
Analysis of Cascaded Two-Ports | p. 333 |
Analysis of Arbitrarily Connected Two-Ports | p. 337 |
Arbitrarily Connected Networks | p. 338 |
Analysis Using Connection Scattering Matrix | p. 338 |
Multiport Connection Method | p. 341 |
An Example | p. 343 |
Analysis by Subnetwork Growth Method | p. 347 |
Circuits Consisting of Two-Dimensional Planar Components | p. 353 |
Segmentation Method | p. 353 |
Desegmentation Method | p. 359 |
References | p. 369 |
Sensitivity Analysis of Microwave Circuits | p. 371 |
Finite Difference Method | p. 373 |
Adjoint Network Method | p. 373 |
Tellegen's Theorem in Wave Variables | p. 374 |
The Adjoint Network | p. 376 |
Comparison with the Direct Method | p. 380 |
Evaluation of Gradients for Subnetwork Growth Method | p. 382 |
Evaluation of Differential Scattering Matrices | p. 388 |
Sensitivity Invariants for Scattering Matrices | p. 388 |
Differential S-Matrices for Typical Components | p. 392 |
An Example of Evaluation of Sensitivities | p. 393 |
Large Change Sensitivities | p. 397 |
Differential Scattering Matrices for Some Typical Components | p. 402 |
References | p. 401 |
Tolerance Analysis | p. 407 |
Worst-Case Analysis | p. 408 |
Statistical Tolerance Analysis | p. 423 |
Method of Moments | p. 423 |
Monte-Carlo Analysis | p. 426 |
Some Results from Probability Theory and Statistics | p. 427 |
References | p. 430 |
Time Domain Analysis of Microwave Circuits | p. 433 |
Transient Analysis of Transmission Lines | p. 434 |
Laplace Transform Method | p. 441 |
Companion Model Approach | p. 450 |
State Variable Approach | p. 456 |
References | p. 460 |
Matrix Solution Techniques | p. 463 |
Gaussian Elimination | p. 464 |
Pivoting | p. 469 |
L-U Factorization and F-B Substitution | p. 470 |
L-U Decomposition | p. 471 |
Forward Elimination and Back Substitution | p. 475 |
Sparse Matrix Techniques | p. 478 |
Reordering of Equations | p. 479 |
Data Structures for Reordering | p. 486 |
L-U Factorization and F-B Substitution | p. 491 |
Remarks on Sparse Matrix Techniques | p. 498 |
References | p. 499 |
Optimization | |
Introduction to Optimization | p. 505 |
Basic Concepts and Definitions | p. 507 |
Objective Functions for Circuit Optimization | p. 515 |
General Considerations | p. 515 |
Least pth Approximation | p. 516 |
Minimax Approximation | p. 518 |
Constraints | p. 520 |
Transformation of Constraints | p. 520 |
Penalty for Constraint Violation | p. 522 |
Sequential Unconstrained Minimization Technique | p. 522 |
One-Dimensional Optimization Techniques | p. 523 |
Elimination Methods | p. 524 |
Interpolation Methods | p. 530 |
References | p. 540 |
Direct Search Optimization Methods | p. 543 |
Pattern Search Methods | p. 543 |
Hooke and Jeeves Methods | p. 544 |
Powell's Method | p. 546 |
Razor Search Method | p. 548 |
Rotating Coordinates Method | p. 550 |
The Simplex Method | p. 553 |
References | p. 561 |
Gradient Methods for Optimization | p. 563 |
Steepest Descent Method | p. 563 |
Generalized Newton-Raphson Method | p. 566 |
Davidon-Fletcher-Powell Method | p. 567 |
Optimization of Least Square Objective Functions | p. 572 |
References | p. 575 |
CAD Programs | |
A Microwave Circuit Analysis Program (MCAP) | p. 579 |
Program Description | p. 581 |
Flow Chart | p. 581 |
Description of Subroutines | p. 581 |
An Example | p. 583 |
Instructions for Users | p. 586 |
Program Listing | p. 594 |
References | p. 617 |
Cad Programs for Microwave Circuits | p. 619 |
Introduction | p. 619 |
Integrated Design and Manufacturing System Concept | p. 620 |
Summary of Microwave Cad Programs | p. 625 |
Handy-Compact Circuit Analysis on HP-41C Handheld Calculator | p. 626 |
Micro-Compact Circuit Optimization on HP-9845 B/T Desktop Computer | p. 628 |
Super-Compact | p. 632 |
Lumped Element Matching Synthesis with Ampsyn | p. 637 |
Transmission Line Matching Network Synthesis with Cadsyn | p. 639 |
Filsyn | p. 643 |
References | p. 648 |
Index | p. 651 |
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