RTL to GDS-II, or Synthesis, Place, and Route | |
Design Flows | p. 1-1 |
Introduction | p. 1-1 |
Invention | p. 1-2 |
Implementation | p. 1-2 |
Integration | p. 1-5 |
Future Scaling Challenges | p. 1-10 |
Conclusion | p. 1-12 |
Logic Synthesis | p. 2-1 |
Introduction | p. 2-1 |
Behavioral and Register Transfer-Level Synthesis | p. 2-2 |
Two-Level Minimization | p. 2-3 |
Multilevel Logic Minimization | p. 2-4 |
Enabling Technologies for Logic Synthesis | p. 2-10 |
Sequential Optimization | p. 2-11 |
Physical Synthesis | p. 2-13 |
Multivalued Logic Synthesis | p. 2-14 |
Summary | p. 2-15 |
Power Analysis and Optimization from Circuit to Register-Transfer Levels | p. 3-1 |
Introduction | p. 3-1 |
Power Analysis | p. 3-2 |
Circuit-Level Power Optimization | p. 3-8 |
Logic Synthesis for Low Power | p. 3-12 |
Conclusion | p. 3-15 |
Equivalence Checking | p. 4-1 |
Introduction | p. 4-1 |
Equivalence Checking Problem | p. 4-3 |
Boolean Reasoning | p. 4-5 |
Combinational Equivalence Checking | p. 4-10 |
Sequential Equivalence Checking | p. 4-14 |
Summary | p. 4-17 |
Digital Layout - Placement | p. 5-1 |
Introduction: Placement Problem and Contexts | p. 5-1 |
Global Placement | p. 5-4 |
Detailed Placement and Legalizers | p. 5-15 |
Placement Trends | p. 5-17 |
Academic and Industrial Placers | p. 5-19 |
Conclusions | p. 5-20 |
Static Timing Analysis | p. 6-1 |
Introduction | p. 6-1 |
Representation of Combinational and Sequential Circuits | p. 6-1 |
Gate Delay Models | p. 6-3 |
Timing Analysis for Combinational Circuits | p. 6-3 |
Timing Analysis for Sequential Circuits | p. 6-7 |
Clocking Disciplines: Edge-Triggered Circuits | p. 6-8 |
Clocking and Clock-Skew Optimization | p. 6-9 |
Statistical Static Timing Analysis | p. 6-12 |
Conclusion | p. 6-15 |
Structured Digital Design | p. 7-1 |
Introduction | p. 7-1 |
Datapaths | p. 7-2 |
Programmable Logic Arrays | p. 7-13 |
Memory and Register Files | p. 7-15 |
Structured Chip Design | p. 7-17 |
Summary | p. 7-21 |
Routing | p. 8-1 |
Introduction | p. 8-2 |
Types of Routers | p. 8-2 |
A Brief History of Routing | p. 8-4 |
Common Routing Algorithms | p. 8-5 |
Additional Router Considerations | p. 8-9 |
Exploring Challenges of Libraries for Electronic Design | p. 9-1 |
Introduction | p. 9-1 |
What Does It Mean to Design Libraries? | p. 9-1 |
How Did We Get Here, Anyway? | p. 9-2 |
Commercial Efforts | p. 9-5 |
What Makes the Effort Easier? | p. 9-5 |
The Enemies of Progress | p. 9-6 |
Environments That Drive Progress | p. 9-6 |
Libraries and What They Contain | p. 9-6 |
Summary | p. 9-7 |
Design Closure | p. 10-1 |
Introduction | p. 10-1 |
Current Practice | p. 10-13 |
The Future of Design Closure | p. 10-28 |
Conclusion | p. 10-30 |
Tools for Chip-Package Codesign | p. 11-1 |
Introduction | p. 11-1 |
Drivers for Chip-Package Codesign | p. 11-1 |
Digital System Codesign Issues | p. 11-2 |
Mixed-Signal Codesign Issues | p. 11-5 |
I/O Buffer Interface Standard and Other Macromodels | p. 11-5 |
Conclusions | p. 11-7 |
Design Databases | p. 12-1 |
Introduction | p. 12-1 |
History | p. 12-2 |
Modern Database Examples | p. 12-3 |
Fundamental Features | p. 12-4 |
Advanced Features | p. 12-9 |
Technology Data | p. 12-12 |
Library Data and Structures: Design-Data Management | p. 12-13 |
Interoperability Models | p. 12-13 |
FPGA Synthesis and Physical Design | p. 13-1 |
Introduction | p. 13-1 |
System-Level Tools | p. 13-6 |
Logic Synthesis | p. 13-6 |
Physical Design | p. 13-13 |
Looking Forward | p. 13-26 |
Analog and Mixed-Signal Design | |
Simulation of Analog and RF Circuits and Systems | p. 14-1 |
Introduction | p. 14-1 |
Differential-Algebraic Equations for Circuits via Modified Nodal Analysis | p. 14-2 |
Device Models | p. 14-4 |
Basic Circuit Simulation: DC Analysis | p. 14-10 |
Steady-State Analysis | p. 14-13 |
Multitime Analysis | p. 14-17 |
Noise in RF Design | p. 14-25 |
Conclusions | p. 14-35 |
Simulation and Modeling for Analog and Mixed-Signal Integrated Circuits | p. 15-1 |
Introduction | p. 15-2 |
Top-Down Mixed-Signal Design Methodology | p. 15-2 |
Mixed-Signal and Behavioral Simulation | p. 15-8 |
Analog Behavioral and Power Model Generation Techniques | p. 15-14 |
Symbolic Analysis of Analog Circuits | p. 15-18 |
Conclusions | p. 15-20 |
Layout Tools for Analog Integrated Circuits and Mixed-Signal Systems-on-Chip: A Survey | p. 16-1 |
Introduction | p. 16-1 |
Analog Layout Problems and Approaches | p. 16-2 |
Analog Cell Layout Strategies | p. 16-5 |
Mixed-Signal System Layout | p. 16-8 |
Field-Programmable Analog Arrays | p. 16-11 |
Conclusions | p. 16-11 |
Physical Verification | |
Design Rule Checking | p. 17-1 |
Introduction | p. 17-1 |
Geometric Algorithms for Physical Verification | p. 17-6 |
Hierarchical Data Structures | p. 17-7 |
Time Complexity of Hierarchical Analysis | p. 17-8 |
Connectivity Models | p. 17-9 |
Parallel Computing | p. 17-11 |
Future Roles for Verification | p. 17-11 |
Resolution Enhancement Techniques and Mask Data Preparation | p. 18-1 |
Introduction | p. 18-1 |
Lithographic Effects | p. 18-2 |
RET for Smaller k[subscript 1] | p. 18-5 |
Software Implementations of RET Solutions | p. 18-11 |
Mask Data Preparation | p. 18-24 |
Summary | p. 18-27 |
Design for Manufacturability in the Nanometer Era | p. 19-1 |
Introduction | p. 19-1 |
Taxonomy of Yield Loss Mechanisms | p. 19-3 |
Logic Design for Manufacturing | p. 19-6 |
Parametric Design for Manufacturing Methodologies | p. 19-13 |
Design for Manufacturing Integration in the Design Flow: Yield-Aware Physical Synthesis | p. 19-18 |
Summary | p. 19-20 |
Design and Analysis of Power Supply Networks | p. 20-1 |
Introduction | p. 20-1 |
Voltage-Drop Analysis Modes | p. 20-3 |
Linear System Solution Techniques | p. 20-5 |
Models for Power Distribution Networks | p. 20-8 |
Conclusions | p. 20-13 |
Noise Considerations in Digital ICs | p. 21-1 |
Introduction | p. 21-1 |
Why Has Noise Become a Problem for Digital Chips? | p. 21-2 |
Noise Effects in Digital Designs | p. 21-3 |
Static Noise Analysis | p. 21-7 |
Electrical Analysis | p. 21-14 |
Fixing Noise Problems | p. 21-18 |
Summary and Conclusions | p. 21-20 |
Layout Extraction | p. 22-1 |
Introduction | p. 22-1 |
Early History | p. 22-2 |
Problem Analysis | p. 22-2 |
System Capabilities | p. 22-3 |
Converting Drawn Geometries to Actual Geometries | p. 22-4 |
Designed Device Extraction | p. 22-5 |
Connectivity Extraction | p. 22-7 |
Parasitic Resistance Extraction | p. 22-8 |
Capacitance Extraction Techniques | p. 22-10 |
Inductance Extraction Techniques | p. 22-13 |
Network Reduction | p. 22-17 |
Process Variation | p. 22-18 |
Conclusions and Future Study | p. 22-19 |
Mixed-Signal Noise Coupling in System-on-Chip Design: Modeling, Analysis, and Validation | p. 23-1 |
Introduction | p. 23-2 |
Mechanisms and Effects of Mixed-Signal Noise Coupling | p. 23-2 |
Modeling of Mixed-Signal Noise Coupling | p. 23-7 |
Mixed-Signal Noise Measurement and Validation | p. 23-18 |
Application to Placement and Power Distribution Synthesis | p. 23-19 |
Summary | p. 23-21 |
Technology CAD | |
Process Simulation | p. 24-1 |
Introduction | p. 24-1 |
Process Simulation Methods | p. 24-2 |
Ion Implantation | p. 24-3 |
Diffusion | p. 24-8 |
Oxidation | p. 24-12 |
Etch and Deposition | p. 24-13 |
Lithography and Photoresist Modeling | p. 24-20 |
Silicidation | p. 24-20 |
Mechanics Modeling | p. 24-20 |
Putting It All Together | p. 24-22 |
Conclusions | p. 24-23 |
Device Modeling-From Physics to Electrical Parameter Extraction | p. 25-1 |
Introduction | p. 25-1 |
MOS Technology and Intrinsic Device Modeling | p. 25-3 |
Parasitic Junction and Inhomogeneous Substrate Effects | p. 25-20 |
Device Technology Alternatives | p. 25-23 |
Conclusions | p. 25-26 |
High-Accuracy Parasitic Extraction | p. 26-1 |
Introduction | p. 26-2 |
Extraction via Fast Integral Equation Methods | p. 26-3 |
Introduction | p. 26-3 |
Forms of Maxwell's Equations | p. 26-3 |
Fast Field Solvers: Capacitance Solution | p. 26-5 |
Fast Inductance Solution | p. 26-7 |
Distributed RLC and Full Wave | p. 26-11 |
Conclusions | p. 26-14 |
Statistical Capacitance Extraction | p. 26-14 |
Introduction | p. 26-14 |
Theory | p. 26-15 |
Characteristics | p. 26-17 |
Summary | p. 26-22 |
Index | p. 1 |
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