Electron Microscopy and Analysis

By: Peter J. Goodhew, John Humphreys, Richard Beanland

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Paperback | 30 November 2000 | Edition Number 3

At a Glance

Paperback
264 Pages

Edition Type
New edition

Dimensions(cm)
23.39 x 15.6 x 1.4

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$207.50

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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

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Acronyms	p. ix
Preface	p. xi
Microscopy with light and electrons	p. 1
Introduction	p. 1
Methods of image formation	p. 2
Pixels	p. 3
The light-optical microscope	p. 4
Magnification	p. 7
Resolution	p. 8
Depth of field and depth of focus	p. 12
Aberrations in optical systems	p. 14
Electrons versus light	p. 16
Questions	p. 19
Electrons and their interaction with the specimen	p. 20
Introduction	p. 20
Electrons	p. 20
Generating a beam of electrons	p. 24
Deflection of electrons--magnetic lenses	p. 27
The scattering of electrons by atoms	p. 29
Elastic scattering	p. 30
Inelastic scattering	p. 31
Secondary effects	p. 34
The family of electron microscopes	p. 37
Questions	p. 38
Electron diffraction	p. 40
The geometry of electron diffraction	p. 41
Diffraction spot patterns	p. 47
Use of the reciprocal lattice in diffraction analysis	p. 51
Other types of diffraction pattern	p. 58
Questions	p. 64
The transmission electron microscope	p. 66
The instrument	p. 66
Contrast mechanisms	p. 76
High voltage electron microscopy (HVEM)	p. 108
Scanning transmission electron microscopy (STEM)	p. 110
Preparation of specimens for TEM	p. 110
Questions	p. 121
The scanning electron microscope	p. 122
How it works	p. 122
Obtaining a signal in the SEM	p. 124
The optics of the SEM	p. 131
The performance of the SEM	p. 133
The ultimate resolution of the SEM	p. 135
Topographic images	p. 141
Compositional images	p. 146
Crystallographic information from the SEM	p. 149
The use of other signals in the SEM	p. 153
Image acquisition, processing and storage	p. 159
The preparation of specimens for examination in the SEM	p. 162
Low voltage microscopy	p. 164
Environmental scanning electron microscopy (ESEM)	p. 166
Questions	p. 167
Chemical analysis in the electron microscope	p. 169
The generation of X-rays within a specimen	p. 170
Detection and counting of X-rays	p. 174
X-ray analysis of bulk specimens	p. 184
X-ray analysis of thin specimens in the TEM	p. 193
Quantitative analysis in an electron microscope	p. 196
Electron energy loss spectroscopy (EELS)	p. 205
A brief comparison of techniques	p. 212
Questions	p. 213
Electron microscopy and other techniques	p. 214
Complementary imaging techniques	p. 214
Complementary analysis techniques--alternative analysis systems	p. 225
Complementary diffraction techniques	p. 233
Summary	p. 234
Questions	p. 234
Further reading	p. 236
Answers	p. 238
Index	p. 243
Table of Contents provided by Syndetics. All Rights Reserved.

Electron Microscopy and Analysis

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