Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

By: Mohammad Tehranipoor (Editor)

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Hardcover | 10 December 2007

At a Glance

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424 Pages

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23.5 x 15.88 x 2.54

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Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

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Non-Fiction Engineering & Technology Technology in General Nanotechnology Electronics & Communications Engineering Electronics Engineering Circuits & Components Mechanical Engineering & Materials Production & Industrial Engineering Industrial Quality Control Energy Technology & Engineering Electrical Engineering

Test and Defect Tolerance for Crossbar-Based Architectures	p. 1
Defect-Tolerant Logic with Nanoscale Crossbar Circuits	p. 5
Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics	p. 33
Test and Defect Tolerance for Reconfigurable Nanoscale Devices	p. 63
A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology	p. 95
Defect Tolerance in Crossbar Array Nano-Architectures	p. 121
Test and Defect Tolerance for QCA Circuits	p. 153
Reversible and Testable Circuits for Molecular QCA Design	p. 157
Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems	p. 203
QCA Circuits for Robust Coplanar Crossing	p. 227
Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata	p. 251
Testing Microfluidic Biochips	p. 265
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems	p. 267
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips	p. 287
Reliability for Nanotechnology Devices	p. 313
Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields	p. 315
Towards Nanoelectronics Processor Architectures	p. 339
Design and Analysis of Fault-Tolerant Molecular Computing Systems	p. 373
Index	p. 399
Table of Contents provided by Ingram. All Rights Reserved.

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

At a Glance

Hardcover

Shipping

How to return your order

Defective items

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