Fiber Optic Measurement Techniques
By: Rongqing Hui, Maurice O'Sullivan
Hardcover | 1 November 2008 | Edition Number 1
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672 Pages
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Fiber Optic Measurement Techniques is an indispensable collection of key optical measurement techniques essential for developing and characterizing today's photonic devices and fiber optic systems. The book gives comprehensive and systematic descriptions of various fiber optic measurement methods with the emphasis on the understanding of optoelectronic signal processing methodologies, helping the reader to weigh up the pros and cons of each technique and establish their suitability for the task at hand.
Carefully balancing descriptions of principle, operations and optoelectronic circuit implementation, this indispensable resource will enable the engineer to:
- Understand the implications of various measurement results and system performance qualifications
- Characterize modern optical systems and devices
- Select optical devices and subsystems in optical network design and implementation
- Design innovative instrumentations for fiber optic systems
This book brings together in one volume the fundamental principles with the latest techniques, making it a complete resource for the optical and communications engineer developing future optical devices and fiber optic systems.
"Optical fiber communication systems and networks constitute the core of the telecom infrastructure of the information society worldwide. Accurate knowledge of the properties of the contituent components, and of the performance of the subsystems and systems must be obtained in order to ensure reliable transmission, distribution, and delivery of information. This book is an authoritative and comprehensive treatment of fiber-optic measurement techniques, including not only fundamental principles and methodologies but also various instrumentations and practical implementations. It is an excellent up-to-date resource and reference for the academic and industrial researcher as well as the field engineer in manufacturing and network operations." -Dr. Tingye Li, AT&T Labs (retired) Rongqing Hui received his PhD in Electrical Engineering from Politecnico di Torino, Italy in 1993. He is currently a tenured professor in the department of Electrical Engineering and Computer Science at the University of Kansas. He has published more than 90 refereed technical papers in the area of fiber-optic communications and holds 13 patents. Dr. Hui currently serves as an Associate Editor of IEEE Transactions on Communications. Maurice O'Sullivan has worked for Nortel for a score of years, at first in the optical cable business, developing factory-tailored metrology for optical fiber, but, in the main, in the optical transmission business developing, modeling and verifying physical layer designs & performance of Nortel's line and highest rate transmission product including OC-192, MOR, MOR+, LH1600G, eDCO and eDC40G. He holds a Ph.D. in physics (high resolution spectroscopy) from the University of Toronto, is a Nortel Fellow and has been granted more than 30 patents.
- The only book to combine explanations of the basic principles with latest techniques to enable the engineer to develop photonic systems of the future
- Careful and systematic presentation of measurement methods to help engineers to choose the most appropriate for their application
- The latest methods covered, such as real-time optical monitoring and phase coded systems and subsystems, making this the most up-to-date guide to fiber optic measurement on the market
Industry Reviews
Preface | p. xi |
About the Author | p. xv |
Constants | p. xvii |
Fundamentals of Optical Devices | p. 1 |
Introduction | p. 2 |
Laser Diodes and LEDs | p. 4 |
Pn Junction and Energy Diagram | p. 5 |
Direct and Indirect Semiconductors | p. 6 |
Carrier Confinement | p. 7 |
Spontaneous Emission and Stimulated Emission | p. 8 |
Light-Emitting Diodes (LEDs) | p. 9 |
Laser Diodes (LDs) | p. 13 |
Single-Frequency Semiconductor Lasers | p. 26 |
Photodetectors | p. 32 |
Pn-Junction Photodiodes | p. 32 |
Responsivity and Bandwidth | p. 34 |
Electrical Characteristics of a Photodiode | p. 36 |
Photodetector Noise and SNR | p. 37 |
Avalanche Photodiodes (APDs) | p. 41 |
Optical Fibers | p. 44 |
Reflection and Refraction | p. 44 |
Propagation Modes in Optical Fibers | p. 49 |
Optical Fiber Attenuation | p. 62 |
Group Velocity and Dispersion | p. 67 |
Nonlinear Effects in an Optical Fiber | p. 77 |
Optical Amplifiers | p. 85 |
Optical Gain, Gain Bandwidth, and Saturation | p. 86 |
Semiconductor Optical Amplifiers | p. 89 |
Erbium-Doped Fiber Amplifiers (EDFAs) | p. 100 |
External Electro-Optic Modulator | p. 115 |
Basic Operation Principle of Electro-Optic Modulators | p. 116 |
Frequency Doubling and Duo-Binary Modulation | p. 121 |
Optical Single-Side Modulation | p. 123 |
Optical Modulators Using Electro-Absorption Effect | p. 125 |
Basic Instrumentation for Optical Measurement | p. 129 |
Introduction | p. 130 |
Grating-Based Optical Spectrum Analyzers | p. 131 |
General Specifications | p. 131 |
Fundamentals of Diffraction Gratings | p. 134 |
Basic OSA Configurations | p. 138 |
Scanning FP Interferometer | p. 146 |
Basic FPI Configuration and Transfer Function | p. 146 |
Scanning FPI Spectrum Analyzer | p. 153 |
Scanning FPI Basic Optical Configurations | p. 157 |
Optical Spectrum Analyzer Using the Combination of Grating and FPI | p. 159 |
Mach-Zehnder Interferometers | p. 160 |
Transfer Matrix of a 2 x 2 Optical Coupler | p. 161 |
Transfer Function of an MZI | p. 162 |
MZI Used as an Optical Filter | p. 164 |
Michelson Interferometers | p. 168 |
Operating Principle of a Michelson Interferometer | p. 169 |
Measurement and Characterization of Michelson Interferometers | p. 172 |
Techniques to Increase Frequency Selectivity | p. 174 |
Optical Wavelength Meter | p. 179 |
Operating Principle of a Wavelength Meter Based on Michelson Interferometer | p. 180 |
Wavelength Coverage and Spectral Resolution | p. 183 |
Wavelength Calibration | p. 185 |
Wavelength Meter Based on Fizeau Wedge Interferometer | p. 186 |
Optical Polarimeter | p. 188 |
General Description of Lightwave Polarization | p. 188 |
The Stokes Parameters and the Poincare Sphere | p. 190 |
Optical Polarimeters | p. 193 |
Measurement Based on Coherent Optical Detection | p. 196 |
Operating Principle | p. 196 |
Receiver SNR Calculation of Coherent Detection | p. 199 |
Balanced Coherent Detection and Polarization Diversity | p. 202 |
Phase Diversity in Coherent Homodyne Detection | p. 204 |
Coherent OSA Based on Swept Frequency Laser | p. 207 |
Waveform Measurement | p. 211 |
Oscilloscope Operating Principle | p. 212 |
Digital Sampling Oscilloscopes | p. 216 |
High-Speed Sampling of Optical Signal | p. 219 |
High-Speed Electric ADC Using Optical Techniques | p. 223 |
Short Optical Pulse Measurement Using an Autocorrelator | p. 224 |
Optical Low-Coherent Interferometry | p. 232 |
Optical Low-Coherence Reflectometry | p. 232 |
Fourier-Domain Reflectometry | p. 240 |
Optical Network Analyzer | p. 246 |
S-Parameters and RF Network Analyzer | p. 246 |
Optical Network Analyzers | p. 249 |
Characterization of Optical Devices | p. 259 |
Introduction | p. 260 |
Characterization of RIN and Linewidth of Semiconductor Lasers | p. 260 |
Measurement of Relative Intensity Noise (RIN) | p. 261 |
Measurement of Laser Phase Noise and Linewidth | p. 266 |
Measurement of Electro-Optic Modulation Response | p. 276 |
Characterization of Intensity Modulation Response | p. 277 |
Measurement of Frequency Chirp | p. 282 |
Time-Domain Measurement of Modulation-Induced Chirp | p. 292 |
Wideband Characterization of an Optical Receiver | p. 296 |
Characterization of Photodetector Responsivity and Linearity | p. 297 |
Frequency Domain Characterization of Photodetector Response | p. 299 |
Photodetector Bandwidth Characterization Using Source Spontaneous-Spontaneous Beat Noise | p. 301 |
Photodetector Characterization Using Short Optical Pulses | p. 304 |
Characterization of Optical Amplifiers | p. 306 |
Measurement of Amplifier Optical Gain | p. 306 |
Measurement of Static and Dynamic Gain Tilt | p. 311 |
Optical Amplifier Noise | p. 314 |
Optical Domain Characterization of ASE Noise | p. 316 |
Impact of ASE Noise in Electrical Domain | p. 318 |
Noise Figure Definition and Its Measurement | p. 323 |
Time-Domain Characteristics of EDFA | p. 327 |
Characterization of Passive Optical Components | p. 329 |
Fiber-Optic Couplers | p. 330 |
Fiber Bragg Grating Filters | p. 335 |
WDM Multiplexers and Demultiplexers | p. 340 |
Characterization of Optical Filter Transfer Functions | p. 345 |
Optical Isolators and Circulators | p. 353 |
Optical Fiber Measurement | p. 365 |
Introduction | p. 366 |
Classification of Fiber Types | p. 367 |
Standard Optical Fibers for Transmission | p. 367 |
Specialty Optical Fibers | p. 370 |
Measurement of Fiber Mode-Field Distribution | p. 374 |
Near-Field, Far-Field, and Mode-Field Diameter | p. 375 |
Far-Field Measurement Techniques | p. 378 |
Near-Field Measurement Techniques | p. 380 |
Fiber Attenuation Measurement and OTDR | p. 382 |
Cutback Technique | p. 382 |
Optical Time-Domain Reflectometers | p. 384 |
Improvement Considerations of OTDR | p. 391 |
Fiber Dispersion Measurements | p. 394 |
Intermodal Dispersion and Its Measurement | p. 395 |
Chromatic Dispersion and Its Measurement | p. 400 |
Polarization Mode Dispersion (PMD) Measurement | p. 409 |
Representation of Fiber Birefringence and PMD Parameter | p. 409 |
Pulse Delay Method | p. 413 |
The Interferometric Method | p. 415 |
Poincare Arc Method | p. 418 |
Fixed Analyzer Method | p. 420 |
The Jones Matrix Method | p. 424 |
The Mueller Matrix Method | p. 431 |
Determination of Polarization-Dependent Loss | p. 438 |
PMD Sources and Emulators | p. 442 |
Measurement of Fiber Nonlinearity | p. 446 |
Measurement of Stimulated Brillouin Scattering Coefficient | p. 447 |
Measurement of the Stimulated Raman Scattering Coefficient | p. 453 |
Measurement of Kerr effect nonlinearity | p. 459 |
Optical System Performance Measurements | p. 481 |
Introduction | p. 482 |
Overview of Fiber-Optic Transmission Systems | p. 483 |
Optical System Performance Considerations | p. 484 |
Receiver BER and Q | p. 486 |
System Q Estimation Based on Eye Diagram Parameterization | p. 494 |
Bit Error Rate Testing | p. 499 |
Receiver Sensitivity Measurement and OSNR Tolerance | p. 508 |
Receiver Sensitivity and Power Margin | p. 509 |
OSNR Margin and Required OSNR (R-OSNR) | p. 514 |
BER vs. Decision Threshold Measurement | p. 521 |
Waveform Distortion Measurements | p. 524 |
Jitter Measurement | p. 527 |
Basic Jitter Parameters and Definitions | p. 527 |
Jitter Detection Techniques | p. 532 |
In-situ Monitoring of Linear Propagation Impairments | p. 537 |
In Situ Monitoring of Chromatic Dispersion | p. 537 |
In Situ PMD Monitoring | p. 541 |
In Situ PDL Monitoring | p. 551 |
Measurement of Nonlinear Crosstalk in Multi-Span WDM systems | p. 556 |
XPM-Induced Intensity Modulation in IMDD Optical Systems | p. 556 |
XPM-induced Phase Modulation | p. 572 |
FWM-Induced Crosstalk in IMDD Optical Systems | p. 575 |
Characterization of Raman Crosstalk with Wide Channel Separation | p. 581 |
Modulation Instability and Its Impact in WDM Optical Systems | p. 590 |
Modulation-instability and Transfer Matrix Formulation | p. 590 |
Impact of Modulation Instability in Amplified Multispan Fiber Systems | p. 600 |
Characterization of Modulation Instability in Fiber-Optic Systems | p. 601 |
Optical System Performance Evaluation Based On Required OSNR | p. 606 |
Measurement of R-SNR Due to Chromatic Dispersion | p. 607 |
Measurement of R-SNR Due to Fiber Nonlinearity | p. 610 |
Measurement of R-OSNR Due to Optical Filter Misalignment | p. 615 |
Fiber-Optic Recirculating Loop | p. 616 |
Operation Principle of a Recirculating Loop | p. 617 |
Measurement Procedure and Time Control | p. 618 |
Optical Gain Adjustment in the Loop | p. 622 |
Index | p. 631 |
Table of Contents provided by Ingram. All Rights Reserved. |
ISBN: 9780123738653
ISBN-10: 0123738652
Published: 1st November 2008
Format: Hardcover
Language: English
Number of Pages: 672
Audience: Professional and Scholarly
Publisher: ACADEMIC PR INC
Country of Publication: US
Edition Number: 1
Dimensions (cm): 22.86 x 15.49 x 3.81
Weight (kg): 1.0
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