Handbook of Transparent Conductors

Cover -- Handbook of Transparent Conductors -- Preface -- Contents -- Contributors -- Chapter 1: Transparent Conductors -- 1.1 Basics -- 1.2 History of Transparent Conducting Oxides -- 1.3 Diversity of Transparent Conductors -- 1.4 Emerging Applications -- 1.4.1 Transistors and Flexible Transparent Electronics -- 1.4.2 Electrochromic Windows -- 1.4.3 Optical Arrays -- 1.5 Chapter Topics -- References -- Chapter 2: Electronic Structure of Transparent Conducting Oxides -- 2.1 Introduction -- 2.2 Band Structures of n-Type Oxides -- 2.3 Band Structures of p-Type Oxides and Other Cu Oxides -- 2.4 Band Line-ups and Work Functions -- 2.5 Ability to Dope -- 2.6 Effect of Disorder-Disorder in Amorphous Semiconductors -- 2.7 Disorder in Oxide Semiconductors -- 2.8 Summary -- References -- Chapter 3: Modeling, Characterization, and Properties of Transparent Conducting Oxides -- 3.1 Introduction -- 3.1.1 A Semi-quantitative Assessment of Grain-Boundary Scattering in TCOs -- 3.1.2 The Free-Electron Theory -- 3.1.3 Application of the Drude Theory -- 3.2 Measuring Transport Properties in TCOs -- 3.2.1 History of Transport Phenomena -- 3.2.2 Qualitative Review of Transport Phenomena -- 3.2.3 Transport Theory -- 3.2.4 First-Order Non-parabolicity -- 3.2.5 Density-of-States Effective Mass -- 3.2.6 Sample Configuration -- 3.2.7 MFC Results on TCOs -- 3.3 Improving TCO Figure of Merit Through Improved Optical Performance -- 3.4 Summary -- References -- Chapter 4: Characterization of TCO Materials -- 4.1 Introduction -- 4.2 Electrical/Optical Characterization -- 4.2.1 Resistivity Measurements -- 4.2.2 Thickness Determination: X-Ray Reflectivity -- 4.2.3 Hall Measurement of Transport Properties: Hall Mobility and Carrier Density -- 4.2.4 Transistor-Based Transport Measurements -- 4.2.5 Surface Characterization Via Scanning Probe Microscopy -- 4.2.6 Optical Characterization -- 4.2.7 Work Function Measurement -- 4.3 Microstructural/Crystallographic Characterization -- 4.3.1 Crystal Structure and Microstructure: Crystalline Indium Oxide -- 4.3.2 Electron Diffraction Studies of Amorphous In2O3-Based Thin Films -- 4.3.3 Structural Analysis of Amorphous IZO Films -- 4.4 Measurement of Biaxial Stress in TCO Thin Films -- 4.5 Summary -- References -- Chapter 5: In Based TCOs -- 5.1 Introduction for In Based TCOs -- 5.2 Crystal Structure and Electronic Structure of In2O3 and Sn Doped In2O3 (ITO) -- 5.3 Electrical and Optical Properties of In2O3-SnO2 Films -- 5.4 Electrical, Optical and Thermal Properties of Amorphous In2O3-ZnO Films -- References -- Chapter 6: Transparent Conducting Oxides Based on Tin Oxide -- 6.1 Introduction -- 6.2 Crystal Structure -- 6.3 Chemistry -- 6.4 Physical Properties -- 6.4.1 Band Structure -- 6.4.2 Transport Properties -- 6.4.3 Optical Properties -- 6.4.4 Amorphous SnO2 -- 6.4.5 Mechanical Properties and Corrosion Behavior -- 6.5 Thin Film Disposition -- 6.5.1 Substrates -- 6.5.2 Spray Pyrolysis -- 6.5.3 Chemical Vapor Deposition -- 6.5.4 Sputtering -- 6.5.5 Other Deposition Methods -- 6.6 Applications -- 6.6.1 Transparent Thin Film Transistors -- 6.6.2 Gas Sensors -- 6.6.3 Transparent Conductive Oxides -- 6.6.4 Magnetic Properties of SnO2 Semiconductors -- References -- Chapter 7: Transparent Conductive Zinc Oxide and Its Derivatives -- T$29.