High Resolution Focused Ion Beams
FIB and its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
By: Jon Orloff, Lynwood Swanson, Mark Utlaut
Paperback | 20 September 2012
At a Glance
Paperback
$349.17
Aims to ship in 7 to 10 business days
ISBN: 9781461352297
ISBN-10: 1461352290
Published: 20th September 2012
Format: Paperback
Language: English
Number of Pages: 320
Audience: Professional and Scholarly
Publisher: Springer Nature B.V.
Country of Publication: US
Dimensions (cm): 23.39 x 15.6 x 1.7
Weight (kg): 0.45
Shipping
Standard Shipping | Express Shipping | |
---|---|---|
Metro postcodes: | $9.99 | $14.95 |
Regional postcodes: | $9.99 | $14.95 |
Rural postcodes: | $9.99 | $14.95 |
How to return your order
At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.
Additional postage charges may be applicable.
Defective items
If there is a problem with any of the items received for your order then the Booktopia Customer Care team is ready to assist you.
For more info please visit our Help Centre.
You Can Find This Book In
This product is categorised by
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials ScienceTesting of Materials
- Non-FictionSciencePhysicsNuclear Physics
- Non-FictionScienceScience in General
- Non-FictionEngineering & TechnologyIndustrial Chemistry & Manufacturing Technologies
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringElectronic Devices & MaterialsSemi-Conductors & Super-Conductors
- Non-FictionSciencePhysicsOptical Physics
- Non-FictionEngineering & TechnologyOther Technologies & Applied SciencesApplied OpticsLaser Technology & Holography