| Preface to second edition | p. xi |
| Preface to first edition | p. xv |
| Introduction | p. 1 |
| Generation and transmission of electric energy | p. 1 |
| Voltage stresses | p. 3 |
| Testing voltages | p. 5 |
| Testing with power frequency voltages | p. 5 |
| Testing with lightning impulse voltages | p. 5 |
| Testing with switching impulses | p. 6 |
| D.C. voltages | p. 6 |
| Testing with very low frequency voltage | p. 7 |
| References | p. 7 |
| Generation of high voltages | p. 8 |
| Direct voltages | p. 9 |
| A.C. to D.C. conversion | p. 10 |
| Electrostatic generators | p. 24 |
| Alternating voltages | p. 29 |
| Testing transformers | p. 32 |
| Series resonant circuits | p. 40 |
| Impulse voltages | p. 48 |
| Impulse voltage generator circuits | p. 52 |
| Operation, design and construction of impulse generators | p. 66 |
| Control systems | p. 74 |
| References | p. 75 |
| Measurement of high voltages | p. 77 |
| Peak voltage measurements by spark gaps | p. 78 |
| Sphere gaps | p. 79 |
| Reference measuring systems | p. 91 |
| Uniform field gaps | p. 92 |
| Rod gaps | p. 93 |
| Electrostatic voltmeters | p. 94 |
| Ammeter in series with high ohmic resistors and high ohmic resistor voltage dividers | p. 96 |
| Generating voltmeters and field sensors | p. 107 |
| The measurement of peak voltages | p. 109 |
| The Chubb--Fortescue method | p. 110 |
| Voltage dividers and passive rectifier circuits | p. 113 |
| Active peak-reading circuits | p. 117 |
| High-voltage capacitors for measuring circuits | p. 118 |
| Voltage dividing systems and impulse voltage measurements | p. 129 |
| Generalized voltage generation and measuring circuit | p. 129 |
| Demands upon transfer characteristics of the measuring system | p. 132 |
| Fundamentals for the computation of the measuring system | p. 139 |
| Voltage dividers | p. 147 |
| Interaction between voltage divider and its lead | p. 163 |
| The divider's low-voltage arm | p. 171 |
| Fast digital transient recorders for impulse measurements | p. 175 |
| Principles and historical development of transient digital recorders | p. 176 |
| Errors inherent in digital recorders | p. 179 |
| Specification of ideal A/D recorder and parameters required for h.v. impulse testing | p. 183 |
| Future trends | p. 195 |
| References | p. 196 |
| Electrostatic fields and field stress control | p. 201 |
| Electrical field distribution and breakdown strength of insulating materials | p. 201 |
| Fields in homogeneous, isotropic materials | p. 205 |
| The uniform field electrode arrangement | p. 206 |
| Coaxial cylindrical and spherical fields | p. 209 |
| Sphere-to-sphere or sphere-to-plane | p. 214 |
| Two cylindrical conductors in parallel | p. 218 |
| Field distortions by conducting particles | p. 221 |
| Fields in multidielectric, isotropic materials | p. 225 |
| Simple configurations | p. 227 |
| Dielectric refraction | p. 232 |
| Stress control by floating screens | p. 235 |
| Numerical methods | p. 241 |
| Finite difference method (FDM) | p. 242 |
| Finite element method (FEM) | p. 246 |
| Charge simulation method (CSM) | p. 254 |
| Boundary element method | p. 270 |
| References | p. 278 |
| Electrical breakdown in gases | p. 281 |
| Classical gas laws | p. 281 |
| Velocity distribution of a swarm of molecules | p. 284 |
| The free path [gamma] of molecules and electrons | p. 287 |
| Distribution of free paths | p. 290 |
| Collision-energy transfer | p. 291 |
| Ionization and decay processes | p. 294 |
| Townsend first ionization coefficient | p. 295 |
| Photoionization | p. 301 |
| Ionization by interaction of metastables with atoms | p. 301 |
| Thermal ionization | p. 302 |
| Deionization by recombination | p. 302 |
| Deionization by attachment--negative ion formation | p. 304 |
| Mobility of gaseous ions and deionization by diffusion | p. 308 |
| Relation between diffusion and mobility | p. 314 |
| Cathode processes--secondary effects | p. 316 |
| Photoelectric emission | p. 317 |
| Electron emission by positive ion and excited atom impact | p. 317 |
| Thermionic emission | p. 318 |
| Field emission | p. 319 |
| Townsend second ionization coefficient [gamma] | p. 321 |
| Secondary electron emission by photon impact | p. 323 |
| Transition from non-self-sustained discharges to breakdown | p. 324 |
| The Townsend mechanism | p. 324 |
| The streamer or 'Kanal' mechanism of spark | p. 326 |
| The sparking voltage--Paschen's law | p. 333 |
| Penning effect | p. 339 |
| The breakdown field strength (E[subscript b]) | p. 340 |
| Breakdown in non-uniform fields | p. 342 |
| Effect of electron attachment on the breakdown criteria | p. 345 |
| Partial breakdown, corona discharges | p. 348 |
| Positive or anode coronas | p. 349 |
| Negative or cathode corona | p. 352 |
| Polarity effect--influence of space charge | p. 354 |
| Surge breakdown voltage--time lag | p. 359 |
| Breakdown under impulse voltages | p. 360 |
| Volt--time characteristics | p. 361 |
| Experimental studies of time lags | p. 362 |
| References | p. 365 |
| Breakdown in solid and liquid dielectrics | p. 367 |
| Breakdown in solids | p. 367 |
| Intrinsic breakdown | p. 368 |
| Streamer breakdown | p. 373 |
| Electromechanical breakdown | p. 373 |
| Edge breakdown and treeing | p. 374 |
| Thermal breakdown | p. 375 |
| Erosion breakdown | p. 381 |
| Tracking | p. 385 |
| Breakdown in liquids | p. 385 |
| Electronic breakdown | p. 386 |
| Suspended solid particle mechanism | p. 387 |
| Cavity breadkdown | p. 390 |
| Electroconvection and electrohydrodynamic model of dielectric breakdown | p. 391 |
| Static electrification in power transformers | p. 393 |
| References | p. 394 |
| Non-destructive insulation test techniques | p. 395 |
| Dynamic properties of dielectrics | p. 395 |
| Dynamic properties in the time domain | p. 398 |
| Dynamic properties in the frequency domain | p. 404 |
| Modelling of dielectric properties | p. 407 |
| Applications to insulation ageing | p. 409 |
| Dielectric loss and capacitance measurements | p. 411 |
| The Schering bridge | p. 412 |
| Current comparator bridges | p. 417 |
| Loss measurement on complete equipment | p. 420 |
| Null detectors | p. 421 |
| Partial-discharge measurements | p. 421 |
| The basic PD test circuit | p. 423 |
| PD currents | p. 427 |
| PD measuring systems within the PD test circuit | p. 429 |
| Measuring systems for apparent charge | p. 433 |
| Sources and reduction of disturbances | p. 448 |
| Other PD quantities | p. 450 |
| Calibration of PD detectors in a complete test circuit | p. 452 |
| Digital PD instruments and measurements | p. 453 |
| References | p. 456 |
| Overvoltages, testing procedures and insulation coordination | p. 460 |
| The lightning mechanism | p. 460 |
| Energy in lightning | p. 460 |
| Nature of danger | p. 465 |
| Simulated lightning surges for testing | p. 466 |
| Switching surge test voltage characteristics | p. 468 |
| Laboratory high-voltage testing procedures and statistical treatment of results | p. 472 |
| Dielectric stress--voltage stress | p. 472 |
| Insulation characteristics | p. 473 |
| Randomness of the appearance of discharge | p. 473 |
| Types of insulation | p. 473 |
| Types of stress used in high-voltage testing | p. 473 |
| Errors and confidence in results | p. 479 |
| Laboratory test procedures | p. 479 |
| Standard test procedures | p. 484 |
| Testing with power frequency voltage | p. 484 |
| Distribution of measured breakdown probabilities (confidence in measured P(V)) | p. 485 |
| Confidence intervals in breakdown probability (in measured values) | p. 487 |
| Weighting of the measured breakdown probabilities | p. 489 |
| Fitting of the best fit normal distribution | p. 489 |
| Insulation coordination | p. 492 |
| Insulation level | p. 492 |
| Statistical approach to insulation coordination | p. 495 |
| Correlation between insulation and protection levels | p. 498 |
| Modern power systems protection devices | p. 500 |
| MOA--metal oxide arresters | p. 500 |
| References | p. 507 |
| Design and testing of external insulation | p. 509 |
| Operation in a contaminated environment | p. 509 |
| Flashover mechanism of polluted insulators under a.c. and d.c. | p. 510 |
| Model for flashover of polluted insulators | p. 511 |
| Measurements and tests | p. 512 |
| Measurement of insulator dimensions | p. 513 |
| Measurement of pollution severity | p. 514 |
| Contamination testing | p. 517 |
| Contamination procedure for clean fog testing | p. 518 |
| Clean fog test procedure | p. 519 |
| Fog characteristics | p. 520 |
| Mitigation of contamination flashover | p. 520 |
| Use of insulators with optimized shapes | p. 520 |
| Periodic cleaning | p. 520 |
| Grease coating | p. 521 |
| RTV coating | p. 521 |
| Resistive glaze insulators | p. 521 |
| Use of non-ceramic insulators | p. 522 |
| Design of insulators | p. 522 |
| Ceramic insulators | p. 523 |
| Polymeric insulators (NCI) | p. 526 |
| Testing and specifications | p. 530 |
| In-service inspection and failure modes | p. 531 |
| References | p. 531 |
| Index | p. 533 |
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