![Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach - Pradeep Lall](https://www.booktopia.com.au/covers/big/9780367400972/2135/influence-of-temperature-on-microelectronics-and-system-reliability.jpg)
Influence of Temperature on Microelectronics and System Reliability
A Physics of Failure Approach
By: Pradeep Lall, Michael G. Pecht, Edward B. Hakim
Paperback | 19 June 2019
At a Glance
Paperback
RRP $83.99
$66.75
21%OFF
Aims to ship in 7 to 10 business days
ISBN: 9780367400972
ISBN-10: 0367400979
Published: 19th June 2019
Format: Paperback
Language: English
Number of Pages: 336
Audience: Professional and Scholarly
Publisher: Taylor & Francis Ltd
Country of Publication: GB
Dimensions (cm): 25.4 x 17.78 x 1.78
Weight (kg): 0.77
Shipping
Standard Shipping | Express Shipping | |
---|---|---|
Metro postcodes: | $9.99 | $14.95 |
Regional postcodes: | $9.99 | $14.95 |
Rural postcodes: | $9.99 | $14.95 |
How to return your order
At Booktopia, we offer hassle-free returns in accordance with our returns policy. If you wish to return an item, please get in touch with Booktopia Customer Care.
Additional postage charges may be applicable.
Defective items
If there is a problem with any of the items received for your order then the Booktopia Customer Care team is ready to assist you.
For more info please visit our Help Centre.
You Can Find This Book In
This product is categorised by
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics Engineering
- Non-FictionEngineering & TechnologyEnergy Technology & EngineeringElectrical Engineering
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMechanical Engineering
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsProduction & Industrial EngineeringIndustrial Quality Control
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials Science
- Non-FictionEngineering & TechnologyTechnology in GeneralTechnical Design