Kelvin Probe Force Microscopy
From Single Charge Detection to Device Characterization
By: Sascha Sadewasser (Editor), Thilo Glatzel (Editor)
Hardcover | 19 March 2018
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ISBN: 9783319756868
ISBN-10: 3319756869
Series: Springer Series in Surface Sciences
Published: 19th March 2018
Format: Hardcover
Language: English
Number of Pages: 548
Audience: Professional and Scholarly
Publisher: Springer Nature B.V.
Country of Publication: CH
Dimensions (cm): 23.39 x 15.6 x 3.02
Weight (kg): 0.94
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This product is categorised by
- Non-FictionScienceChemistryAnalytical ChemistrySpectrum Analysis
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials ScienceTesting of Materials
- Non-FictionEngineering & TechnologyIndustrial Chemistry & Manufacturing TechnologiesOther Manufacturing TechnologiesPrecision Instruments Manufacture
- Non-FictionScienceScience in GeneralScientific StandardsMensuration & Systems of Measurement
- Non-FictionEngineering & TechnologyTechnology in GeneralNanotechnology
- Non-FictionScienceScience in GeneralScientific EquipmentMicroscopy
- Non-FictionSciencePhysicsThermodynamics & Heat
- Non-FictionEngineering & TechnologyTechnology in GeneralInstruments & Instrumentation EngineeringEngineering Measurement & Calibration
- Non-FictionScienceChemistryPhysical Chemistry