![Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact - Cor Claeys](https://cdn.kobo.com/book-images/Images/4e5523dd-558e-4fac-9cec-865ae5095f52/300/300/False/image.jpg)
Metal Impurities in Silicon- and Germanium-Based Technologies
Origin, Characterization, Control, and Device Impact
By: Cor Claeys, Eddy Simoen
eBook | 14 August 2018
Sorry, we are not able to source the ebook you are looking for right now.
We did a search for other ebooks with a similar title, however there were no matches. You can try selecting from a similar category, click on the author's name, or use the search box above to find your ebook.
ISBN: 9783319939254
ISBN-10: 3319939254
Series: Springer Series in Materials Science : Book 270
Published: 14th August 2018
Format: ePUB
Language: English
Publisher: Springer International Publishing
Volume Number: 270
You Can Find This eBook In
Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringMicrowave TechnologyElectronic Devices & MaterialsSemi-Conductors & Super-ConductorsCircuits & ComponentsMechanical Engineering & MaterialsMaterials ScienceTesting of MaterialsCommunications Engineering & Telecommunications
This product is categorised by
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringMicrowave Technology
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringElectronic Devices & MaterialsSemi-Conductors & Super-Conductors
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringCircuits & Components
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials ScienceTesting of Materials
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringCommunications Engineering & Telecommunications
- Non-FictionSciencePhysicsMaterials & States of Matter