Recent Developments in Instrumentation for X-Ray Microanalysis | p. 1 |
High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors | p. 11 |
Efficiency Calibration of a Si(Li) Detector by EPMA | p. 21 |
Wavelength-Dispersive X-Ray Spectrometry | p. 29 |
X-Ray Spectrum Processing and Multivariate Analysis | p. 37 |
Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope | p. 49 |
On the Spatial Resolution in Analytical Electron Microscopy | p. 59 |
Contamination in Analytical Electron Microscopy and in ALCHEMI | p. 65 |
Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy | p. 73 |
Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials | p. 77 |
Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations | p. 83 |
Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br.I) Nano- and Microcrystals | p. 87 |
Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs | p. 93 |
SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation | p. 97 |
Surface Characterisation and Modification of YBCO Thin Films by STM | p. 101 |
Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA | p. 109 |
EPMA Sputter Depth Profiling. Part I: Theory and Evaluation | p. 125 |
EPMA Sputter Depth Profiling. Part II: Experiment | p. 133 |
Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS | p. 141 |
Quantitative EDS Analysis of SiO[subscript 2]/Al[subscript 2]O[subscript 3]/TiO[subscript 2] Multilayer Films | p. 149 |
Surface Ionization of Thin Films on Substrates: Measurement and Simulation | p. 155 |
Comparison of Different Methods to Characterize Thin a-Si:H Films | p. 163 |
EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation | p. 171 |
Analysis of Thin Films with Slightly Rough Boundaries | p. 177 |
Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method | p. 181 |
EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs | p. 187 |
EPMA of Melted UO[subscript 2] Fuel Rods from the Phebus-FP Reactor Accident Experiment | p. 191 |
Steels, Carbon Concentration, and Microhardness | p. 201 |
Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods | p. 207 |
EPMA of the Composition of Opal-Based Nanostructured Materials | p. 211 |
NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas | p. 219 |
Compositional X-Ray Maps of Metamorphic and Magmatic Minerals | p. 227 |
Chemical Mapping of Weathering Stages in Laterites | p. 237 |
Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications | p. 247 |
Composition of 15-17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium | p. 253 |
Potassium Migration in Silica Glass During Electron Beam Irradiation | p. 269 |
X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples | p. 273 |
Environmental SEM and X-Ray Microanalysis of Biological Materials | p. 283 |
Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM | p. 295 |
The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam | p. 301 |
Standardless Analysis | p. 307 |
A New Technique for Standardless Analysis by EPMA-TWIX | p. 317 |
Stopping Power Factor for Standardless QEPMA | p. 321 |
On the Measurement of the Backscattering Coefficient for Low Energy Electrons | p. 325 |
Monte Carlo Simulations of Edge Artefacts in MULSAM Images | p. 333 |
Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations | p. 341 |
A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs | p. 351 |
Fractals and BaTiO[subscript 3]-Ceramic Microstructure Analysis | p. 365 |
Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies | p. 371 |
Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions | p. 379 |
The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects | p. 387 |
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