Progress in Nanoscale Characterization and Manipulation

By: Chen Wang (Editor), Xuedong Bai (Editor), Rongming Wang (Editor), Jing Tao (Editor), Hongzhou Zhang (Editor)

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Hardcover | 14 September 2018

At a Glance

Hardcover
518 Pages

Dimensions(cm)
23.5 x 15.5 x 4.45

Hardcover

$259.01

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This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

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