Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment : Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Op - Denis Flandre

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Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment

Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Op

By: Denis Flandre (Editor), Alexei Nazarov (Editor), Peter L.F. Hemment (Editor)

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Hardcover | 15 February 2005

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364 Pages

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24.13 x 16.51 x 2.54

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This proceedings volume archives the contributions of the speakers who attended the NATO Advanced Research Workshop on "Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment" held at the Sanatorium Puscha Ozerna, th th Kyiv, Ukraine, from 25 to 29 April 2004. The semiconductor industry has maintained a very rapid growth during the last three decades through impressive technological achievements which have resulted in products with higher performance and lower cost per function. After many years of development semiconductor-on-insulator materials have entered volume production and will increasingly be used by the manufacturing industry. The wider use of semiconductor (especially silicon) on insulator materials will not only enable the benefits of these materials to be further demonstrated but, also, will drive down the cost of substrates which, in turn, will stimulate the development of other novel devices and applications. In itself this trend will encourage the promotion of the skills and ideas generated by researchers in the Former Soviet Union and Eastern Europe and their incorporation in future collaborations.

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Preface	p. ix
Technology and Economics
High temperature electronics - cluster effects	p. 1
On the evolution of SOI materials and devices	p. 11
SOI Technology as a basis for microphotonic-microelectronic integrated devices	p. 27
SOI Material Technologies
Smart Cut Technology: the path for advanced SOI substrates	p. 39
Porous silicon based SOI: history and prospects	p. 53
Achievement of SiGe-on-insulator technology	p. 65
CVD diamond films for SOI technologies	p. 77
Radical beam quasiepitaxy technology for fabrication of wide-gap semiconductors on insulator	p. 85
Impact of hydrostatic pressure during annealing of Si:O on creation of SIMOX-like structures	p. 91
SiO[subscript 2] and Si[subscript 3]N[subscript 4] phase formation by ion implantation with in-situ ultrasound treatment	p. 97
Fabrication and characterisation of Silicon On Insulator substrates incorporating thermal vias	p. 103
Reliability and Operation of SOI Devices in Harsh Environment
Reliability and electrical fluctuations in advanced SOI CMOS devices	p. 109
Hydrogen and high-temperature charge instability of SOI structures and MOSFETs	p. 121
Recent advances in SOI MOSFET devices and circuits for ultra-low power/high temperature applications	p. 133
Silicon-on-insulator circuits for application at high temperatures	p. 145
High-voltage SOI devices for automotive applications	p. 155
Heat generation analysis in SOI LDMOS power transistors	p. 167
Novel SOI MOSFET structure for operation over a wide range of temperatures	p. 179
MOSFETs scaling down: advantages and disadvantages for high temperature applications	p. 185
Temperature dependence of RF losses in high-resistivity SOI substrates	p. 191
Radiation Effects
Review of radiation effects in single- and multiple-gate SOI MOSFETs	p. 197
Radiation effects in SOI: Irradiation by high energy ions and electrons	p. 215
Radiation characteristics of short p-channel MOSFETs on SOI substrates	p. 221
Total dose behavior of partially depleted DeleCut SOI MOSFETs	p. 227
Radiation effect on electrical properties of fully-depleted UNIBOND SOI MOSFETs	p. 233
Characterization and Simulation of SOI Devices Operating Under Harsh Environment
Low cost high temperature test system for SOI devices	p. 241
Characterization of carrier generation in thin-film SOI devices by reverse gated-diode technique and its application at high temperatures	p. 247
Back-gate induced noise overshoot in partially-depleted SOI MOSFETs	p. 255
Novel SOI Devices and Sensors Operating at Harsh Conditions
SiGe heterojunction bipolar transistors on insulating substrates	p. 261
Silicon-on-Insulator substrates with buried ground planes (GPSOI)	p. 273
High-voltage high-current DMOS transistor compatible with high-temperature thin-film SOI CMOS applications	p. 279
A novel low leakage EEPROM cell for application in an extended temperature range (-40 [degree]C up to 225 [degree]C)	p. 285
Design, fabrication and characterization of SOI pixel detectors of ionizing radiation	p. 291
Polysilicon-on-insulator layers at cryogenic temperatures and high magnetic fields	p. 297
Planar photomagnetic effect SOI sensors for various applications with low detection limit	p. 303
Theoretical limit for the SiO[subscript 2] thickness in silicon MOS devices	p. 309
Compact model of the nanscale gate-all-around MOSFET	p. 321
Self-assembled semiconductor nanowires on silicon and insulating substrates: Experimental behavior	p. 327
Fabrication of SOI nano devices	p. 333
Keyword Index	p. 345
Table of Contents provided by Ingram. All Rights Reserved.

Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment

Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Op

At a Glance

Hardcover

Shipping

How to return your order

Defective items

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