| Sizing the Intrinsic Gain Stage | p. 1 |
| The Intrinsic Gain Stage | p. 1 |
| The Intrinsic Gain Stage Frequency Response | p. 1 |
| Sizing the Intrinsic Gain Stage | p. 3 |
| Sizing the I.G.S. with the Quadratic Model | p. 4 |
| Sizing the I.G.S. by Means of the Weak Inversion Model | p. 4 |
| Sizing the I.G.S. in the Moderate Inversion Region | p. 5 |
| The gm/ID Sizing Methodology | p. 7 |
| Conclusions | p. 8 |
| The Charge Sheet Model Revisited | p. 11 |
| Why the Charge Sheet Model? | p. 11 |
| The Generic Drain Current Equation | p. 11 |
| The Charge Sheet Model Drain Current Equation | p. 13 |
| Common Source Characteristics | p. 15 |
| The ID(VD) Characteristics | p. 15 |
| The ID(VG) Characteristic of the Saturated Transistor | p. 17 |
| Drift and Diffusion Contributions to the Drain Current | p. 18 |
| Weak Inversion Approximation of the Charge Sheet Mode | p. 18 |
| The gm/ID Ratio in the Common Source Configuration | p. 20 |
| Common Gate Characteristics of the Saturated Transistor | p. 23 |
| A Few Concluding Remarks Concerning the C.S.M | p. 24 |
| Graphical Interpretation of the Charge Sheet Model | p. 25 |
| A Graphical Representation of ID | p. 25 |
| More on the VT Curve | p. 28 |
| Two Approximate Representations of VT | p. 29 |
| The 'Linear' Surface Potential Approximation | p. 29 |
| The 'Linear' Threshold Voltage VT Approximation | p. 31 |
| A Few Examples Illustrating the Use of the Graphical Construction | p. 32 |
| The MOS Diode | p. 32 |
| The MOS Source Follower | p. 32 |
| The CMOS Inverter | p. 33 |
| Small Signal Transconductances | p. 34 |
| CMOS Transmission Gates | p. 35 |
| How to Implement Quasi-linear Resistors with MOS Transistors | p. 36 |
| Source-Bootstrapping | p. 37 |
| A Closer Look to the Pinch-Off Region | p. 38 |
| Conclusion | p. 39 |
| Compact Modeling | p. 41 |
| The Basic Compact Model | p. 41 |
| The E.K.V. Model | p. 42 |
| The VT(V) Characteristic | p. 42 |
| The Drain Current | p. 45 |
| The Equations of the Basic E.K.V. Model | p. 46 |
| Graphical Interpretation of the E.K.V. Model | p. 47 |
| The Common Source Characteristics ID (VG) | p. 48 |
| Strong and Weak Inversion Asymptotic Approximations Derived from the Compact Model | p. 50 |
| Checking the Compact Model Against the C.S.M | p. 50 |
| The Acquisition Algorithm (MATLAB Identif3.m) | p. 50 |
| Verification | p. 52 |
| Evaluation of gm/ID | p. 54 |
| Sizing the Intrinsic Gain Stage by Means of the E.K.V. Model | p. 55 |
| The Common-Gate gms/ID Ratio | p. 57 |
| An Earlier Compact Model | p. 58 |
| Modeling Mobility Degradation | p. 59 |
| The Impact of Mobility Degradation on the Drain Current | p. 59 |
| The Impact of Mobility Degradation on the gm/ID Ratio | p. 64 |
| Sizing the Intrinsic Gain Stage in the Presence of Mobility Degradation | p. 65 |
| Conclusion | p. 66 |
| The Real Transistor | p. 67 |
| Short Channel Effects | p. 67 |
| Checking the Validity of the Compact Model when its Parameters vary with the Source and Drain Voltages | p. 6 |
| E.K.V Parameter Identification (MATLAB IdentifDemo.m) | p. 70 |
| How to Introduce Mobility Degradation? | p. 73 |
| Drain Current Reconstruction | p. 75 |
| Compact Model Parameters Versus Bias and Gate Length | p. 76 |
| The Influence of the Gate Length on the Model Parameters | p. 76 |
| The Influence of Bias Conditions on the Parameters | p. 78 |
| Reconstructing ID (vDS) Characteristic | p. 82 |
| Evaluation of gx/ID Ratios | p. 84 |
| The gm/ID Ratio | p. 85 |
| The gd/ID Ratio | p. 88 |
| Conclusions | p. 91 |
| The Real Intrinsic Gain Stage | p. 93 |
| The Dependence on Bias Conditions of the gm/ID and gd/ID Ratios (MATLAB fig061.m) | p. 93 |
| Sizing the I.G.S with 'Semi-empirical' Data | p. 94 |
| Sizing the I.G.S Loaded by a Constant Total Capacitance | p. 95 |
| Introduction of Extrinsic Capacitances | p. 99 |
| Sizing the I.G.S Loaded by a Constant Load Capacitance | p. 103 |
| Model Driven Sizing of the I.G.S | p. 104 |
| Sizing W and ID (MATLAB fig612.m) | p. 104 |
| Evaluation of the Intrinsic Gain (MATLAB fig613.m) | p. 106 |
| An Alternative Method to Evaluate the Gain (MATLAB fig615.m) | p. 107 |
| A Simplified Sizing Procedure | p. 110 |
| Slew-Rate Considerations | p. 111 |
| Conclusions | p. 112 |
| The Common-Gate Configuration | p. 113 |
| Drain Current Versus Source-to-Substrate Voltage (Matlab fig071.m) | p. 113 |
| The Cascoded Intrinsic Gain Stage | p. 115 |
| Sizing the Cascode (Matlab fig074.m) | p. 115 |
| Gain Evaluation of the Cascode (MATLAB fig075.m) | p. 117 |
| The Poles of the Cascode Circuit (MATLAB fig075.m) | p. 118 |
| Sizing the Miller Op. Amp | p. 121 |
| Introductory Considerations | p. 121 |
| The Miller Op. Amp | p. 121 |
| Analysis of the Miller Operational Amplifier | p. 122 |
| Pole Splitting | p. 123 |
| The Impact of the Current Mirror | p. 126 |
| Poles and Zeros | p. 127 |
| Sizing the Miller Operational Amplifier (MATLAB OpAmp.m) | p. 129 |
| Sizing a Low-voltage Miller Op. Amp | p. 130 |
| Sizing a High-Frequency Low-Power Miller Op. Amp | p. 140 |
| Conclusion | p. 142 |
| How to Utilize the Data available under 'extras.springer.com' | p. 143 |
| Global Variables | p. 143 |
| An Example Making Use of the 'Semi-empirical' Data: The Evaluation of Drain Currents and gm/Io Ratio Matrices (MATLAB A12.m) | p. 144 |
| An Example Making Use of the E.K.V Global Variables: The Elaboration of an ID(VGS)Characteristic (Matlab A13.m) | p. 146 |
| The 'MATLAB' Toolbox | p. 149 |
| Charge Sheet Model Files | p. 149 |
| The pMat(T,N,tox) Function | p. 149 |
| The surfpot(p,V,VG) Function | p. 150 |
| The IDsh(p,VS,VD,VG) Function | p. 151 |
| Compact Model Files | p. 151 |
| The Identif3(Nb,tox,VFB,T) Function | p. 151 |
| The invq(z) Function | p. 152 |
| The ComS(VGS,VDS,VS,lg) Function | p. 152 |
| Other Functions | p. 152 |
| The jctCap(L,W,R,V) Function | p. 152 |
| The Gss(x,H) Function | p. 153 |
| Temperature and Mismatch, from C.S.M. to E.K.V. | p. 155 |
| The Influence of the Temperature on the Drain Current (MATLAB A31.m) | p. 155 |
| The Influence of the Temperature on gm/ID (Matlab A32.m) | p. 56 |
| Temperature Dependence of E.K.V Parameters (MATLAB A33.m) | p. 158 |
| The Impact of Technological Mismatches on the Drain Current (Matlab A34.m) | p. 159 |
| Mismatch and E.K.V Parameters (MATLAB A35.m) | p. 161 |
| E.K.V. Intrinsic Capacitance Model | p. 163 |
| Bibliography | p. 167 |
| Index | p. 169 |
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