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$Topics in Electron Diffraction and Microscopy of Materials : Series in Microscopy in Materials Science - Peter. B Hirsch$

Topics in Electron Diffraction and Microscopy of Materials

Name: Topics in Electron Diffraction and Microscopy of Materials
Brand: INST OF PHYSICS PUB
Price: 288.5 AUD
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By: Peter. B Hirsch (Editor)

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Hardcover | 1 January 1999 | Edition Number 1

At a Glance

Hardcover
208 Pages

Dimensions(cm)
23.4 x 15.6 x 1.91

Hardcover

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Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.

The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

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You Can Find This Book In

Non-Fiction Engineering & Technology Mechanical Engineering & Materials Materials Science Science Science in General Scientific Equipment Microscopy Technology in General Engineering in General Physics Materials & States of Matter

Chemistry Crystallography

Foreword
Preface
Authors' addresses
Early days of diffraction contrast transmission electron microscopy	p. 1
Applications of the weak beam technique of electron microscopy	p. 16
Two-beam and n-beam diffraction	p. 34
Pseudo-aberration-free focusing imaging method for atomic resolution electron microscopy of crystals	p. 42
Probing atomic bonding using fast electrons	p. 65
Interpretation of spatially resolved valence loss spectra	p. 79
Is molecular imaging possible?	p. 108
Diffraction imaging using backscattered electrons: fundamentals and applications	p. 126
Developments of dynamical theory of RHEED and applications to the in situ monitoring of MBE growth	p. 154
Index	p. 193
Table of Contents provided by Blackwell. All Rights Reserved.

Topics in Electron Diffraction and Microscopy of Materials

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Hardcover

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