Preface | p. v |
Introduction | p. 1 |
VLSI Design Methodology | p. 3 |
VLSI Design--An Overview | p. 4 |
Summary | p. 23 |
To Probe Further | p. 24 |
Problems | p. 27 |
CMOS Logic Circuits | p. 29 |
nMOS Switch Model | p. 29 |
pMOS Switch Model | p. 32 |
CMOS Inverter | p. 34 |
CMOS Logic Structures | p. 38 |
Complementary Logic | p. 39 |
Pass-Transistor/Transmission-Gate Logic | p. 51 |
Summary | p. 60 |
To Probe Further | p. 61 |
Problems | p. 62 |
IC Layout and Fabrication | p. 69 |
CMOS IC Fabrication | p. 69 |
CMOS Design Rules | p. 78 |
Layout Examples | p. 84 |
Summary | p. 97 |
To Probe Further | p. 97 |
Problems | p. 98 |
CMOS Circuit Characterization | p. 101 |
MOSFET Theory | p. 101 |
Voltage Transfer Characteristic | p. 105 |
Circuit-Level Simulation | p. 109 |
Improved MOSFET Switch Model | p. 112 |
Resistance/Capacitance Estimation | p. 116 |
RC Timing Model | p. 123 |
Transistor Sizing | p. 126 |
[tau]-Model | p. 130 |
Driving Large Loads | p. 135 |
Power Dissipation | p. 138 |
Latch-Up | p. 140 |
Summary | p. 142 |
To Probe Further | p. 142 |
Problems | p. 143 |
Sequential Logic Circuits | p. 147 |
General Structure | p. 147 |
Asynchronous Sequential Logic Circuits | p. 150 |
D-Latch | p. 153 |
D-Flip-Flop | p. 157 |
One-Phase Clock Systems | p. 159 |
Two-Phase, Non-Overlapping Clock Systems | p. 160 |
Clock Distribution | p. 164 |
Sequential Circuit Design | p. 165 |
Summary | p. 169 |
To Probe Further | p. 170 |
Problems | p. 170 |
Alternative Logic Structures | p. 175 |
Complementary Logic Circuits | p. 175 |
Pass-Transistor/Transmission-Gate Logic | p. 176 |
Pseudo-nMOS Logic | p. 177 |
Programmable Logic Array | p. 182 |
Dynamic CMOS Logic | p. 185 |
Domino Logic | p. 190 |
Dynamic Memory Elements | p. 192 |
BiCMOS Logic Circuits | p. 193 |
Summary | p. 194 |
To Probe Further | p. 195 |
Problems | p. 196 |
Sub-System Design | p. 199 |
Adders | p. 200 |
Full Adder Tree | p. 209 |
Parallel Multipliers | p. 211 |
Read-Only Memory | p. 219 |
Random Access Memory | p. 221 |
Summary | p. 225 |
To Probe Further | p. 225 |
Problems | p. 226 |
Chip Design | p. 229 |
Microprocessor Design Project | p. 230 |
Field Programmable Gate Array | p. 244 |
Summary | p. 250 |
To Probe Further | p. 251 |
Problems | p. 251 |
Testing | p. 253 |
Fault Models | p. 255 |
Test Generation (Stuck-at Faults) | p. 258 |
Path Sensitization | p. 261 |
D-Algorithm | p. 262 |
Test Generation for Other Fault Models | p. 266 |
Test Generation Example | p. 267 |
Sequential Circuit Testing | p. 270 |
Design-for-Testability | p. 271 |
Built-In Self-Test | p. 272 |
Summary | p. 277 |
To Probe Further | p. 277 |
Problems | p. 278 |
Physical Design Automation | p. 281 |
Layout Generators and Editors | p. 281 |
Placement and Routing | p. 283 |
Floorplanning and Placement | p. 283 |
Routing | p. 290 |
Summary | p. 305 |
To Probe Further | p. 306 |
Problems | p. 308 |
Parallel Structures | p. 311 |
Parallel Architectures | p. 311 |
Interconnection Networks | p. 314 |
Pipelining | p. 322 |
Pipeline Scheduling | p. 326 |
Parallel Algorithms | p. 329 |
Summary | p. 336 |
To Probe Further | p. 337 |
Problems | p. 337 |
Array Processors | p. 341 |
Array Processing Examples | p. 342 |
Array Processor Design | p. 348 |
Wavefront Array Processor | p. 365 |
To Probe Further | p. 374 |
Problems | p. 375 |
Fault Tolerant Vlsi Architectures | p. 377 |
Reliability | p. 377 |
Fault Tolerant Design | p. 381 |
Fault Tolerant VLSI Arrays | p. 382 |
Set Replacement Algorithm | p. 383 |
Shifting Replacement Algorithm | p. 387 |
Fault Stealing Replacement Algorithm | p. 389 |
Compensation Path Replacement Algorithm | p. 392 |
Summary | p. 393 |
To Probe Further | p. 394 |
Problems | p. 395 |
Index | p. 397 |
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