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eBOOK
Kelvin Probe Force Microscopy
From Single Charge Detection to Device Characterization
By: Sascha Sadewasser (Editor), Thilo Glatzel (Editor)
eBook | 10 March 2018
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ISBN: 9783319756875
ISBN-10: 3319756877
Series: Springer Series in Surface Sciences : Book 65
Published: 10th March 2018
Format: ePUB
Language: English
Publisher: Springer International Publishing
Volume Number: 65
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This product is categorised by
- Non-FictionScienceChemistryAnalytical ChemistrySpectrum Analysis
- Non-FictionEngineering & TechnologyTechnology in GeneralNanotechnology
- Non-FictionEngineering & TechnologyTechnology in GeneralInstruments & Instrumentation EngineeringEngineering Measurement & Calibration
- Non-FictionEngineering & TechnologyIndustrial Chemistry & Manufacturing TechnologiesOther Manufacturing TechnologiesPrecision Instruments Manufacture
- Non-FictionEngineering & TechnologyMechanical Engineering & MaterialsMaterials ScienceTesting of Materials
- Non-FictionScienceScience in GeneralScientific StandardsMensuration & Systems of Measurement
- Non-FictionScienceChemistryPhysical Chemistry
- Non-FictionEngineering & TechnologyElectronics & Communications EngineeringElectronics Engineering