Memory, Microprocessor, and ASIC

By: Wai-Kai Chen

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eText | 26 March 2003 | Edition Number 1

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Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons