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Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor

eBOOK

Test and Diagnosis for Small-Delay Defects

By: Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

eBook | 19 May 2016

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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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Android
eReader
Desktop
IOS
Windows

You Can Find This eBook In

Non-FictionComputing & I.T.Computer HardwareEngineering & TechnologyElectronics & Communications EngineeringElectronics EngineeringCircuits & ComponentsMicrowave TechnologyTechnology in GeneralNanotechnologyEngineering in GeneralComputer Science
Systems Analysis & DesignIndustrial Chemistry & Manufacturing TechnologiesOther Manufacturing TechnologiesPrecision Instruments Manufacture

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